Sun Microsystems, Inc.

Stephan Hoerold

Arjun Dutt

Manjunath D Haritsa

Anup K Sharma

David M Murata

Manishkumar B Ankola

Ralf Schmitt

Kathirqamar Aingaran

Farn Wang

A system and method for performing density-based layer filling on a design layout encoding of an integrated circuit device is disclosed. In some embodiments, the density-based layer filler may identify open areas on a given design layer in which one or more minimum density rules are not met and may insert dummy shapes only in those identified areas. The dummy shapes may be constructed so as not to violate one or more other design rules. The density-based layer filler may access a configuration file comprising layer density rules and other design rules and may generate a run deck dependent on the contents of the configuration file. The density-based layer filler may be applied iteratively to a design in checking windows of various sizes according to multiple window sizes and step values specified in the configuration file. The dummy shapes may be electrically connected to an existing ground wire after insertion.

Density-based layer filler for integrated circuit design

A method for maintaining equivalency between the reference Register Transfer Logic (RTL) and the physical layout design of an integrated circuit by way of maintaining a reference netlist derived from symbolic connectivity.

Fullchip functional equivalency and physical verification

A method for binning and layout of an integrated circuit design which includes providing a table setting forth predefined widths of signal wires and corresponding spacing to shield wires, characterizing effects on timing, noise, and power distribution based on predefined widths and spacing combinations as functions of the length of the signal wire, and laying out the integrated circuit design based upon the predefined widths of signal wires and corresponding spacing to shield wires. The shield wires are adjacent and on both sides of the routed signal wire.

Integrated circuit binning and layout design system

A method and apparatus for determining clock insertion delays for a microprocessor design having a grid-based clock distribution. The method includes partitioning the complete clock net into a global clock net and a plurality of local clock nets, simulating a load for each of the local clock nets, simulating the global clock net, and combining the simulations to form the complete clock net. The method may further include evaluating the combination to determine whether the results converge and storing the simulation results in a Clock Data Model. When the results do not converge, the method re-simulates at least one of the local clock nets and re-simulates the global clock net. The Clock Data Model collects, manages, retrieves, and queries all of the simulation information. The method may further analyze the complete clock net to predict the clock skew for a given data transfer path for potential redesign.

Clock skew verification methodology for grid-based design

A tool for computing noise coupled onto victim lines from aggressor lines of an integrated circuit has code for traversing a victim line of the integrated circuit layout to measure its length, its average width, a coupling length, and a harmonic mean of spacing between the victim line and aggressor lines. The tool has code for computing a resistance, estimated coupling capacitance, and total capacitance of the victim line from these parameters.

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Saratoga, CA, United States of America

Stephan Hoerold