San Diego State University Research Foundation

Centro De Investigaciones En Optica A.c.

Sotero Ordoñes Nogales

Sungbum Kang

In alternative embodiments, provided are moiré profilometry methods for analyzing a topography of an object comprising use of dual patterns that are simultaneously projected onto a surface of the object from two symmetric directions. In alternative embodiments, the projected dual patterns superimpose and generate a fringe pattern that contains a moiré pattern, the moiré pattern having a phase that is modulated according to the topography of the object. In alternative embodiments, the moiré pattern is extracted from the fringe pattern using a spatial or temporal method, and the phase is demodulated from the extracted moiré pattern using a spatial or temporal method.

Growing community of inventors

Guanajuato, Mexico

Sotero Ordoñes Nogales