Growing community of inventors

Tokyo, Japan

Ryohei Kasai

Average Co-Inventor Count = 5.46

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 1

Ryohei KasaiYuichi Yamamoto (2 patents)Ryohei KasaiMasaya Tanaka (2 patents)Ryohei KasaiTeppei Sotoda (2 patents)Ryohei KasaiTadashi Furukawa (2 patents)Ryohei KasaiAyako Furuse (2 patents)Ryohei KasaiTsuyoshi Tsunoda (2 patents)Ryohei KasaiShuji Sagara (2 patents)Ryohei KasaiRyo Furugen (2 patents)Ryohei KasaiTetsushi Hosoda (2 patents)Ryohei KasaiRyohei Kasai (4 patents)Yuichi YamamotoYuichi Yamamoto (133 patents)Masaya TanakaMasaya Tanaka (9 patents)Teppei SotodaTeppei Sotoda (4 patents)Tadashi FurukawaTadashi Furukawa (4 patents)Ayako FuruseAyako Furuse (3 patents)Tsuyoshi TsunodaTsuyoshi Tsunoda (3 patents)Shuji SagaraShuji Sagara (3 patents)Ryo FurugenRyo Furugen (2 patents)Tetsushi HosodaTetsushi Hosoda (2 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Dai Nippon Printing Co., Ltd. (4 from 3,199 patents)


4 patents:

1. 12144120 - Wiring structure and method of manufacturing the same, semiconductor device, multilayer wiring structure and method of manufacturing the same, semiconductor element mounting substrate, method of forming pattern structure, imprint mold and method of manufacturing the same, imprint mold set, and method of manufacturing multilayer wiring board

2. 11191164 - Wiring structure and method of manufacturing the same, semiconductor device, multilayer wiring structure and method of manufacturing the same, semiconductor element mounting substrate, method of forming pattern structure, imprint mold and method of manufacturing the same, imprint mold set, and method of manufacturing multilayer wiring board

3. 10672722 - Mounting component and electronic device

4. 10276515 - Mounting component, wiring substrate, electronic device and manufacturing method thereof

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as of
12/28/2025
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