Growing community of inventors

Cohoes, NY, United States of America

Robin Hsin Kuo Chao

Average Co-Inventor Count = 4.47

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 34

Robin Hsin Kuo ChaoChun Wing Yeung (11 patents)Robin Hsin Kuo ChaoJingyun Zhang (8 patents)Robin Hsin Kuo ChaoKangguo Cheng (7 patents)Robin Hsin Kuo ChaoChoonghyun Lee (7 patents)Robin Hsin Kuo ChaoNicolas J Loubet (7 patents)Robin Hsin Kuo ChaoHeng Wu (7 patents)Robin Hsin Kuo ChaoRuilong Xie (6 patents)Robin Hsin Kuo ChaoChi-Chun Liu (4 patents)Robin Hsin Kuo ChaoZhenxing Bi (3 patents)Robin Hsin Kuo ChaoKristin Schmidt (3 patents)Robin Hsin Kuo ChaoJulien Frougier (2 patents)Robin Hsin Kuo ChaoJohn H Zhang (2 patents)Robin Hsin Kuo ChaoYann Mignot (2 patents)Robin Hsin Kuo ChaoMuthumanickam Sankarapandian (2 patents)Robin Hsin Kuo ChaoCheng Chi (2 patents)Robin Hsin Kuo ChaoDexin Kong (2 patents)Robin Hsin Kuo ChaoHuai Huang (2 patents)Robin Hsin Kuo ChaoScott David Halle (2 patents)Robin Hsin Kuo ChaoPietro Montanini (2 patents)Robin Hsin Kuo ChaoLawrence Alfred Clevenger (1 patent)Robin Hsin Kuo ChaoEffendi Leobandung (1 patent)Robin Hsin Kuo ChaoHemanth Jagannathan (1 patent)Robin Hsin Kuo ChaoFee Li Lie (1 patent)Robin Hsin Kuo ChaoEkmini Anuja De Silva (1 patent)Robin Hsin Kuo ChaoYi Song (1 patent)Robin Hsin Kuo ChaoDerren Neylon Dunn (1 patent)Robin Hsin Kuo ChaoKyong Min Yeo (1 patent)Robin Hsin Kuo ChaoChoongHyun Lee (1 patent)Robin Hsin Kuo ChaoRichard C Johnson (1 patent)Robin Hsin Kuo ChaoNoel Arellano (1 patent)Robin Hsin Kuo ChaoMary Breton (1 patent)Robin Hsin Kuo ChaoRobin Hsin Kuo Chao (25 patents)Chun Wing YeungChun Wing Yeung (73 patents)Jingyun ZhangJingyun Zhang (173 patents)Kangguo ChengKangguo Cheng (2,832 patents)Choonghyun LeeChoonghyun Lee (378 patents)Nicolas J LoubetNicolas J Loubet (284 patents)Heng WuHeng Wu (173 patents)Ruilong XieRuilong Xie (1,180 patents)Chi-Chun LiuChi-Chun Liu (103 patents)Zhenxing BiZhenxing Bi (180 patents)Kristin SchmidtKristin Schmidt (15 patents)Julien FrougierJulien Frougier (219 patents)John H ZhangJohn H Zhang (218 patents)Yann MignotYann Mignot (113 patents)Muthumanickam SankarapandianMuthumanickam Sankarapandian (77 patents)Cheng ChiCheng Chi (65 patents)Dexin KongDexin Kong (53 patents)Huai HuangHuai Huang (51 patents)Scott David HalleScott David Halle (43 patents)Pietro MontaniniPietro Montanini (32 patents)Lawrence Alfred ClevengerLawrence Alfred Clevenger (644 patents)Effendi LeobandungEffendi Leobandung (495 patents)Hemanth JagannathanHemanth Jagannathan (226 patents)Fee Li LieFee Li Lie (174 patents)Ekmini Anuja De SilvaEkmini Anuja De Silva (141 patents)Yi SongYi Song (23 patents)Derren Neylon DunnDerren Neylon Dunn (23 patents)Kyong Min YeoKyong Min Yeo (13 patents)ChoongHyun LeeChoongHyun Lee (13 patents)Richard C JohnsonRichard C Johnson (9 patents)Noel ArellanoNoel Arellano (8 patents)Mary BretonMary Breton (2 patents)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. International Business Machines Corporation (24 from 164,108 patents)

2. Elpis Technologies Inc. (1 from 51 patents)


25 patents:

1. 12046680 - Inner spacer formation for nanosheet transistors

2. 11990530 - Replacement-channel fabrication of III-V nanosheet devices

3. 11842998 - Semiconductor device and method of forming the semiconductor device

4. 11742409 - Replacement-channel fabrication of III-V nanosheet devices

5. 11568101 - Predictive multi-stage modelling for complex process control

6. 11199505 - Machine learning enhanced optical-based screening for in-line wafer testing

7. 11081567 - Replacement-channel fabrication of III-V nanosheet devices

8. 11079337 - Secure wafer inspection and identification

9. 10985273 - Vertical field-effect transistor including a fin having sidewalls with a tapered bottom profile

10. 10978576 - Techniques for vertical FET gate length control

11. 10903315 - Formation of dielectric layer as etch-stop for source and drain epitaxy disconnection

12. 10756177 - Self-limiting and confining epitaxial nucleation

13. 10756178 - Self-limiting and confining epitaxial nucleation

14. 10741639 - Formation of dielectric layer as etch-stop for source and drain epitaxy disconnection

15. 10692203 - Measuring defectivity by equipping model-less scatterometry with cognitive machine learning

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