Corning Incorporated

Richard Anthony Gaona

Ralf Joachim Terbrueggen

Andreas Simon Gaab

John Eric Tyler

Nicolai Martin Haenel

Dale Humphrey

A method of forming a plurality of defects within a substrate with a laser beam focal line using a laser beam, each defect of the plurality of defects being a damage track within the substrate with a diameter of about 10 microns or less, the plurality of defects forming a contour line on the substrate. The substrate having a first surface and a second surface that is opposite from the first surface. The method further includes exerting (i) a first force on the first surface of the substrate at a location that is adjacent to the contour line and (ii) a second force on the second surface of the substrate at a location that is on the contour line. Additionally, the method includes breaking the substrate along the contour line and into a first substrate portion and a second substrate portion.

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Novato, CA, United States of America

Richard Anthony Gaona