Tokyo Electron Limited

Université D'orleans

Remi Dussart

Shigeru Tahara

Jacques Faguet

Kaoru Maekawa

Thomas Tillocher

Philippe Lefaucheux

Gaëlle Antoun

Kumiko Ono

Nagisa Sato

Mingmei Wang

Koichi Yatsuda

Du Zhang

Hojin Kim

An etching method includes: a physical adsorption process of physically adsorbing an adsorbate based on a first processing gas on a film to be etched under a condition that the pressure of the first processing gas is smaller than the saturated vapor pressure of the first processing gas with respect to a temperature of an object to be processed while cooling the object to be processed on which the film to be etched is formed; and an etching process of etching the film to be etched by reacting the adsorbate with the film to be etched by a plasma of a second processing gas.

Etching method and etching apparatus

A method for processing a substrate that includes: loading the substrate in a plasma processing chamber; performing a cyclic plasma etch process including a plurality of cycles, where each cycle of the plurality of cycles includes: generating a first plasma from a first gas mixture including a fluorosilane and oxygen; performing a deposition step by exposing the substrate to the first plasma to form a passivation film including silicon and fluorine; generating a second plasma from a second gas mixture including a noble gas; and performing an etch step by exposing the substrate to the second plasma.

Selective etching with fluorine, oxygen and noble gas containing plasmas

A plasma etching method includes a physisorption step for causing an adsorbate that is based on first processing gas to be physisorbed onto a film to be etched, while cooling an object to be processed on which the film to be etched is provided; and an etching step for etching the film to be etched by causing the adsorbate to react with the film to be etched, using the plasma of second processing gas.

Plasma etching method

Growing community of inventors

Saint-Mesmin, France

Remi Dussart