Qualcomm Incorporated

Rakesh Kumar Sinha

Sharad Kumar Gupta

Priyankar Mathuria

Sei Seung Yoon

Ritu Chaba

Mukund Narasimhan

Shiba Narayan Mohanty

Chirag Gulati

Harikrishna Chintarlapalli Reddy

Pradeep Kumar Sana

Abhinav Murali

Jibu Varghese K

Rahul Sahu

Sajin Mohamad

Veerabhadra Rao Boda

Lakshmikantha Holla Vakwadi

Raghav Gupta

Gururaj Shamanna

An integrated circuit (IC), including: a current mirror, including: a first field effect transistor (FET) including a first drain, a first gate, and a first source, wherein the first source is coupled to a first voltage rail; and a second FET including a second drain, a second gate, and a second source, wherein the second gate is coupled to the first gate of the first FET, and the second source is coupled to the first voltage rail; and a selective coupling circuit configured to selectively couple the first drain of the first FET to the first and second gates of the first and second FETs based on a voltage at the first drain of the first FET.

Bias current receiver with selective coupling circuit

A memory is provided with a logic gate that processes a first version and a second version of a memory clock signal to assert a clock signal for the clocking of latches in a second array of columns for the memory. The first version clocks the latches in a first array of columns for the memory. But the second version does not clock any latches in the first array of columns.

Clock buffering to reduce memory hold time

Certain aspects of the present disclosure provide methods and apparatus for generating a negative boost voltage for memory write operations. One example memory circuit generally includes at least one memory bank, a write circuit coupled to the at least one memory bank, and a boost generation circuit coupled to the write circuit. The boost generation circuit generally includes a first node coupled to a reference potential node of the write circuit; a second node; a first capacitive element having a first terminal coupled to the first node of the boost generation circuit; a first switch configured to selectively couple the first node to a reference potential node for the memory circuit; and a second switch configured to selectively couple a second terminal of the first capacitive element to the second node of the boost generation circuit.

Boost generation circuitry for memory

Systems, methods, and apparatus for writing data into a static random access memory (SRAM) are provided. A write driver circuit includes a bitcell array, a bitline coupled to the bitcell array, and a first driving circuit configured to drive the bitline via a write driver node for writing data into a bitcell for a write operation. The write driver circuit also includes a pre-charging circuit configured to control or to operate with the write driver circuit to drive the write driver node to a high voltage level or a low voltage level for the write operation, and pre-charge the write driver node to the high voltage level, and float the write driver node for a bit-masking operation.

Robust write driver scheme for static random access memory compilers

In an aspect of the disclosure, a method and an apparatus are provided. The apparatus may be a memory. The memory may include a first memory portion configured to store a first bit and generate a first data bit output. The first data bit output may be a function of the first bit when a first read enable is active. The memory may also include a second memory portion configured to store a second bit and generate a second data bit output. The second data bit output may be a function of the second bit when a second read enable is active. The memory may include a switch configured to select between the first and second bits for a read operation based on the first and second data bit outputs.

Efficient memory bank design

A first bitline driver includes a multiplexer for outputting data and write mask signals in functional mode, and test vector signal in test mode; a latch to latch the data signal in functional mode and the test vector signal in test mode; a latch to latch the write mask signal in functional mode and the test vector signal in test mode; a latch to latch the test vector signal and provide it to a scan output; and a write circuit for writing data to a memory cell based on the data signal. A second bitline driver includes a latch to latch a data signal in functional mode if a write mask signal is deasserted and to latch a test vector signal in test mode; a latch to latch the test vector signal and provide it to a scan output; and a write circuit for writing data to a memory cell.

Apparatus and method for implementing design for testability (DFT) for bitline drivers of memory circuits

A write precharge period for a pseudo-dual-port memory is initiated by an edge (rising or falling) of a read precharge signal. The same edge type (rising or falling) of a write precharge signal signals the end of the write precharge period.

Bitline precharge control and tracking scheme providing increased memory cycle speed for pseudo-dual-port memories

Maskable level shifter circuits and memories are provided. Memories may include a plurality of memory cells and a bitline coupled to the plurality of memory cells. The memories includes a maskable level shifter configured to receive write data and a mask signal. A maskable level shifter includes a level shifter configured to level shift the write data and output the level shifted write data to the bitline when the mask signal is inactive and a masking circuit configured to remove power from the level shifter when the mask signal is active. Another maskable level shifter includes a level shifter configured to level shift the write data and output the level shifted write data to the bitline when the mask signal is inactive and a masking circuit configured to output a predetermined state to the bitline when the mask signal is active.

Bit writability implementation for memories

A negative bit line boost circuit for a memory is configured to control a write multiplexer and a write assist transistor so that charge from a boost capacitor positively charges a bit line following a write assist period.

Boost charge recycle for low-power memory

A memory circuit includes a set of subarrays of memory cells and a set of write assist circuits for generating negative voltages on bitlines pertaining to the set of subarrays, respectively. A set of distinct signals initiate the write assist circuits in generating the negative voltages for subarrays, respectively. The distinct signals may have particular state to cause a subset of the write assist circuits to generate the negative voltages if the corresponding subarrays are target of a writing operation, and another state to cause another subset of the write assist circuits to not generate the negative voltages if the corresponding subarrays are not target of the writing operation. This avoids the unnecessary generation of negative voltages for subarrays that are not the target of a writing operation so as to reduce power consumption. The generation of the distinct signals may be based on a set of write mask signals.

Apparatus and method for controlling boost capacitance for low power memory circuits

Disclosed are various apparatuses and methods for a memory with a multiple word line design. A memory timing circuit may include a dummy word line including a first portion and a second portion and further including capacitative loading that is lumped in the second portion of the dummy word line, a first transistor connected to the first portion of the dummy word line and configured to charge the dummy word line, and a second transistor connected to the second portion of the dummy word line and configured to discharge the dummy word line. A method may include charging a dummy word line using a first transistor, and discharging the dummy word line using a second transistor, wherein the dummy word line includes a first portion and a second portion and further includes capacitative loading that is lumped in the second portion of the dummy word line.

Memory timing circuit

An integrated circuit includes one or more bit cells, a word line coupled to the one or more bit cells, and a dummy word line arranged with the word line to have a capacitance therebetween. The capacitance provides a voltage boost or reduction of the word line to assist read and write operations.

Read/write assist for memories

Disclosed are various apparatuses and methods for a memory with a multiple read word line design. A memory may include a plurality of bit cells arranged in a row, a first read word line connected to a first subset of the plurality of bit cells, and a second read word line connected to a second subset of the plurality of bit cells, wherein the first and second subsets are located in the same row of bit cells. A method may include asserting, during a first read operation, a first read word line connected to a first subset of a plurality of bit cells arranged in a row of bit cells, and asserting, during a second read operation, a second read word line connected to a second subset of the plurality of bit cells, wherein the first and second subsets are located in the same row of bit cells.

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Bengaluru, India

Rakesh Kumar Sinha