University of Florida Research Foundation Inc

Intel Corporation

Pravin Dasharth Gaikwad

Swarup Bhunia

Jonathan William Cruz

Nij Dorairaj

Prabuddha Chakraborty

Md Moshiur Rahman

David Kehlet

Aritra Dasgupta

Tamzidul Hoque

Naren Masna

Abhishek Anil Nair

Aritra Bhattacharyay

Sudipta Paria

A method and system are directed to protecting hardware IP, particularly of ASIC designs. Programmability is introduced into an ASIC design to increase the difficulty of formulating ASIC designs as Boolean Satisfiability (SAT) problems. Fine-grain redaction of security-critical information from a design is employed by removing high-entropy logic blocks and subsequently inserting programmable components in place of the redacted portion to hide the actual design intent.

Programmable application-specific array for protecting confidentiality and integrity of hardware IPS

Various embodiments of the present disclosure provide a scan-based architecture for register-transfer-level (RTL) or gate-level designs that improves the security of scan chain-based design-for-testability (DFT) structures. In various embodiments, the scan-based architecture includes invisible scan chains that are hidden in such a way that an attacker cannot easily identify or locate the invisible scan chains for exploitation and revealing internal secure information of the design. The invisible scan chains are dynamically configurable into a scan chain with select flip-flops, such that scan paths of the invisible scan chains may be different between different designs, chips, or testing operations. Various embodiments further employ key-based obfuscation by combining a scan control finite state machine with existing state machines within a design, which improves design security against unauthorized use and increases confidentiality. Specific sequences of key patterns cause the design to transition into a test mode or a normal mode.

Invisible scan architecture for secure testing of digital designs

Embodiments of the present disclosure provide methods, apparatus, and computer program products for generating an insertion netlist for a target circuit configured for inserting a malicious design alteration into the circuit based on a design identifying reference trigger nets. Features are extracted for each net identified in a netlist for the circuit. A set of reference trigger features is generated for each of the reference trigger nets. A net is selected from the netlist for each set of reference trigger features based on a similarity between the features of the net and the set of reference trigger features. The insertion netlist is generated that includes the circuit with the malicious design alteration inserted at each of the selected nets.

Systems and methods for machine intelligence based malicious design alteration insertion

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Gainesville, FL, United States of America

Pravin Dasharth Gaikwad