Sun Microsystems, Inc.

Apple Inc.

Pradeep R Trivedi

Claude R Gauthier

Dean Liu

Brian W Amick

Sudhakar Bobba

Tyler J Thorp

Gin S Yee

Spencer Montgomery Gold

Lynn Ooi

Brian S Leibowitz

Jafar Savoj

Vincent R Von Kaenel

Jose A Tierno

Edgardo F Klass

Brian J Campbell

Emerson S Fang

Sanjeev K Maheshwari

Sridhar Narayanan

Shaishav A Desai

Kamran Zarrineh

Priya Ananthanarayanan

Aninda K Roy

David J Greenhill

Raymond A Heald

Honkai Tam

Fabien S Faure

Joseph Raymond Siegel

Shy Hamami

Huaimin Li

Yaron Cohen

A system and method for efficiently transporting data across lanes. A computing system includes an interconnect with lanes for transporting data between a source and a destination. When a source receives an indication of a bandwidth requirement change from a first data rate to a second data rate, the transmitter in the source sends messages to the receiver in the destination. The messages indicate that the data rate is going to change and reconfiguration of one or more lanes will be performed. The transmitter selects one or more lanes for transporting data at the second data rate. The transmitter maintains data transport at the first data rate while reconfiguring the selected one or more lanes to the second data rate. After completing the reconfiguration, the transmitter transports data at the second data rate on the selected one or more lanes while preventing data transport on any unselected lanes.

Chip to chip interface with scalable bandwidth

An apparatus includes an oscillator circuit, a counter circuit, and a control circuit. The oscillator circuit may receive an input clock signal and an inverse input clock signal, and, for a first time period, may generate an oscillator output signal with a frequency based on a duty cycle of the input clock signal. For a second time period, the oscillator circuit may generate the oscillator output signal with a frequency based on a duty cycle of the inverse input clock signal. The counter circuit may count oscillations of the oscillator output signal over the first time period and over the second time period. The control circuit may determine, based on the oscillations counted by the counter circuit during the first time period and the second time period, a duty cycle value indicative of the duty cycle of the input clock signal.

Digital on-chip duty cycle monitoring device

Modular delay line blocks include a plurality of delay elements, each including a delay unit, an input, an output, a next element output, and an element return path. The delay elements are coupled together in a chain between a block input and a block output. The block input is coupled to the input of a first element in the chain and the block output is coupled to the output of the first element. In addition, the next element output of the first element is coupled to the element input of a next element in the chain, and the element output of the next delay element is coupled to the element return path of a previous element in the chain. In response to a selection control signal, each element may selectively route a signal from the element input to one of the next element output or to the element output.

Modular programmable delay line blocks for use in a delay locked loop

A delay locked loop (DLL) includes a delay line configured to provide a delayed version of a reference clock as a feedback clock. The DLL also includes a phase detector that may provide an output signal that is indicative of a change in a delay associated with the delay line. The DLL may also include a step size controller that may provide a step size indication corresponding to a first step size in response to detecting the output signal indicating a first change in delay, and to provide a step size indications corresponding to a second step size that is smaller than the first step size in response to detecting the output signal indicating a second change in delay.

Delay locked loop including a mechanism for reducing lock time

A clock gater circuit comprises a plurality of transistors having source-drain connections forming a stack between a first node and a supply node. A given logical state on the first node causes a corresponding logical state on an output clock of the clock gater circuit. In one embodiment, a first transistor of the plurality of transistors has a gate coupled to receive an enable input signal. A second transistor is connected in parallel with the first transistor, and has a gate controlled responsive to a test input signal to ensure that the output clock is generated even if the enable input signal is not in an enabled state. In another embodiment, the plurality of transistors comprises a first transistor having a gate controlled responsive to a clock input of the clock gater circuit and a second transistor having a gate controlled responsive to an output of a delay circuit. The delay circuit comprises at least one inverter, wherein an input of the delay circuit is the clock input, and wherein a first inverter of the delay circuit is coupled to receive a test input signal and is configured to force a first logical state on an output of the first inverter responsive to an assertion of the test input signal.

Clock gater with test features and low setup time

A flop circuit comprises a precharge circuit for precharging a first node in response to an occurrence of a first phase of a timing signal, and a discharge circuit for conditionally discharging the first node in response to an occurrence of a second phase of the timing signal depending upon a data input signal. The flop circuit further comprises a voltage retention circuit, such as a latch, configured to store a retained logic value that depends upon a logic value present at the first node during at least a portion of the second phase of the timing signal, and an output circuit configured to generate an output signal that depends upon the data input signal. The output circuit may be configured to drive the output signal in a first logic state when the first node is discharged regardless of the retained logic value, and may be configured to drive the output signal in a logic state that depends upon the retained logic value when the first node is charged. In one particular embodiment, the output circuit is implemented using a NAND gate.

Low latency flop circuit

A Mobile Subscriber Directory Assistance (MSDA) system including originating carrier center initiating a directory assistance call, a directory assistance center providing a directory assistance service, and a search environment. The search environment includes an aggregated pointer database and at least one directory number resolution database. A caller requesting a telephone number is connected to a directory assistance service center where search criteria for the requested number are taken. The requested number is identified by searching the aggregated pointer database and the directory number resolution database. The caller is connected to the identified telephone number without releasing this identified telephone number.

Method and apparatus for receiver circuit tuning

A calibration and adjustment system for post-fabrication control of a delay locked loop bias-generator is provided. The calibration and adjustment system includes an adjustment circuit operatively connected to the bias-generator, where the adjustment circuit is controllable to facilitate a modification of a voltage output by the bias-generator. Such control of the voltage output by the bias-generator allows a designer to achieve a desired delay locked loop performance characteristic after the delay locked loop has been fabricated. A representative value of the amount of adjustment desired in the bias-generator output may be stored and subsequently read to adjust the delay locked loop.

Method and apparatus to store delay locked loop biasing parameters

A method and apparatus for compensating for age related degradation in the performance of integrated circuits. In one embodiment, the phase-locked loop (PLL) charge pump is provided with multiple legs that can be selectively enabled or disabled to compensate for the effects of aging. In an alternate embodiment, the power supply voltage control codes can be increased or decreased to compensate for aging effects. In another embodiment, a ring oscillator is used to approximate the effects of NBTI. In this embodiment, the frequency domain is converted to time domain using digital counters and programmable power supply control words are used to change the operating parameters of the power supply to compensate for aging effects.

Compensation technique to mitigate aging effects in integrated circuit components

An adjustment and calibration system for post-fabrication treatment of a phase locked loop input receiver is provided. The adjustment and calibration system includes at least one adjustment circuit, to which the phase locked loop input receiver is responsive, and a storage device that selectively stores control information (1) associated with a state of the adjustment circuit and/or (2) from a tester that writes such control information to the storage device, where the control information stored in the storage device is subsequently selectively read out in order to adjust the adjustment circuit to a state corresponding to the control information.

Adjustment and calibration system for post-fabrication treatment of phase locked loop input receiver

A method and apparatus for sensing an aging effect on an integrated circuit using a sensor disposed on the integrated circuit and arranged to generate an output dependent on a condition of an element within the sensor. A processor operatively connected to the sensor is arranged to indicate a code dependent the output.

Embedded integrated circuit aging sensor system

A method and apparatus for post-fabrication calibration and adjustment of a phase locked loop leakage current is provided. The calibration and adjustment system includes an adjustment circuit that adjusts a leakage current offset circuit to compensate for the leakage current of a capacitor. The capacitor connects to a control voltage of the phase locked loop. Such control of the leakage current in the phase locked loop allows a designer to achieve a desired phase locked loop operating characteristic after the phase locked loop has been fabricated. A representative value of the amount of compensation desired in the leakage current may be stored and subsequently read to adjust the phase locked loop.

Calibration technique for phase locked loop leakage current

A method and apparatus for assigning a set of region-based voltage drop budgets to an integrated circuit is provided. Further, a method for partitioning an integrated circuit into optimal voltage drop regions includes analyzing the integrated circuit for worst-case voltage drop data. The worst-case voltage drop data is used to partition the integrated circuit into a set of voltage drop regions, wherein each voltage drop region is assigned a region-based voltage drop budget. The region-based voltage drop budget assigned to a particular voltage drop region is based on a worst-case voltage drop experienced by that voltage drop region.

Growing community of inventors

Sunnyvale, CA, United States of America

Pradeep R Trivedi