United Microelectronics Corp.

Po-Hsieh Lin

Chia-Fu Hsu

Szu-Hao Lai

Ming-Chih Chen

Yi-Chuen Eng

Bei-Zhun Syu

A semiconductor device and a fabrication method thereof are provided. The semiconductor device includes a semiconductor body, a first doped region, a second doped region, a gate and a dielectric layer. The semiconductor body is disposed on a dielectric substrate and has a protrusion portion, a first portion and a second portion. The first portion and the second portion are respectively disposed at two opposite sides of the protrusion portion. The first doped region is disposed in a top of the protrusion portion. The second doped region is disposed in an end of the first portion far away from the protrusion portion. The gate is disposed on the first portion and adjacent to the protrusion portion. The dielectric layer is disposed between the gate and the protrusion portion, and between the gate and the first portion.

Semiconductor device and fabrication method thereof

A memory device includes: a substrate; a channel layer on the substrate, in which the channel layer includes a T-shape having a horizontal portion with a first end and a second end and a vertical portion having a third end; a gate structure on a side of the vertical portion; an oxide-nitride-oxide (ONO) layer between the gate structure and the vertical portion; a source region on the first end of the horizontal portion; and a drain region on the third end of the vertical portion.

Growing community of inventors

Tainan, Taiwan

Po-Hsieh Lin