Agere Systems Inc.

Western Electric Company, Inc.

Philip William Seitzer

Sailesh Mansinh Merchant

Taeho Kook

Daniel Patrick Chesire

Fred J Schneider

Joze E Antol

Raymond H Booth

Wayne Rademacher

James C Golden

Steven V Stang

George F Wilkinson, Jr

Vance Dolvan Archer

Daniel J Roman

Calvin Lee Schumacher

Rafe Carl Mengel

Joel R Bitler

Thomas B Gans

Michael W Bodnar

Disclosed herein are novel support structures for pad reinforcement in conjunction with new bond pad designs for semiconductor devices. The new bond pad designs avoid the problems associated with probe testing by providing a probe region that is separate from a wire bond region. Separating the probe regionfrom the wire bond regionand forming the bond padover active circuitry has several advantages. By separating the probe regionfrom the wire bond region, the wire bond regionis not damaged by probe testing, allowing for more reliable wire bonds. Also, forming the bond padover active circuitry, including metal interconnect layers, allows the integrated circuit to be smaller.

Reinforced bond pad for a semiconductor device

A method of electrical testing devices such as integrated circuits that include conductive pads formed on the surface. A material having a desired bulk resistivity and viscosity is applied to either the device or the electrical probe prior to testing. The application of the material has been found to substantially reduce the need for cleaning of the probe.

Method of electrical testing of an integrated circuit with an electrical probe

Method of electrical testing

A hybrid integrated circuit package (11) typically includes a circuit substrate or article (12) on which are formed thin film components (17, 18, 19) of a circuit (22) and to which is bonded at least one semiconductor chip (21). Prior to bonding the chip (21) to the article (12) the circuit (22) undergoes various tests and adjustment operations. An electric element, preferably a resistance element (36), is formed on the article (12). The element (36) is functionally independent of the circuit (22) on the article (12). A first, initial value of the element (36) marks the article (12) as belonging to a first group of articles having first circuit characteristics. The initial value of the element (36) is selectively altered to a second value upon a determination that the article (12) has circuit characteristics other than those of the first group. In the described preferred embodiment the first group is a group of electrically acceptable articles (12), while other characteristics are those of defective articles. The mark is typically altered by a current of sufficient magnitude to burn portions of the element (36), or by selective application of radiant energy such as a laser beam (83). Identifying the altered mark permits articles (12) having defective circuits thereon to be selectively eliminated from further processing steps.

Methods of marking and electrically identifying an article

A Hybrid Integrated Circuit package (11) typically includes a circuit substrate or article (12) on which are formed thin film components (17, 18, 19) of a circuit (22) and to which is bonded at least one semiconductor chip (21). Prior to bonding the chip (21) to the article (12) the circuit (22) undergoes various tests and adjustment operations. An electric element, preferably a resistance element (36), is formed on the article (12). The element (36) is functionally independent of the circuit (22) on the article (12). A first, initial value of the element (36) marks the article (12) as belonging to a first group of articles having first circuit characteristics. The initial value of the element (36) is selectively altered to a second value upon a determination that the article (12) has circuit characteristics other than those of the first group. In the described preferred embodiment the first group is a group of electrically acceptable articles (12), while other characteristics are those of defective articles. The mark is typically altered by a current of sufficient magnitude to burn portions of the element (36), or by selective application of radiant energy such as a laser beam (83). Identifying the altered mark permits articles (12) having defective circuits thereon to be selectively eliminated from further processing steps.

Article carrying a distinctive mark

Growing community of inventors

Bethlehem, PA, United States of America

Philip William Seitzer