Xilinx, Inc.

Philip D Costello

Venu M Kondapalli

Martin L Voogel

Manoj Chirania

Steven P Young

Vasisht Mantra Vadi

Trevor J Bauer

David P Schultz

Atul V Ghia

Hare Krishna Verma

Kamal Chaudhary

Adebabay M Bekele

Brian C Gaide

Suresh M Menon

Santosh Yachareni

Sridhar Krishnamurthy

Jason Helge Anderson

Philip M Freidin

Paul T Sasaki

Warren E Cory

Shekhar Bapat

Shidong Zhou

Scott O Frake

Tien Duc Pham

Anil Kumar Kandala

Robert I Fu

Santiago G Asuncion

Sandeep Vundavalli

Subodh Gupta

Vikram Santurkar

Robert I-Che Fu

An interconnect multiplexer comprises a plurality of CMOS pass gates of a first multiplexer stage coupled to receive data to be output by the interconnect multiplexer; an output inverter coupled to the outputs of the plurality of CMOS pass gates, wherein an output of the output inverter is an output of the interconnect multiplexer; and a plurality of memory elements coupled to the plurality of CMOS pass gates; wherein inputs to the plurality of CMOS pass gates are pulled to a common potential during a startup mode. A method of reducing contention currents in an integrated circuit is also disclosed.

Interconnect multiplexers and methods of reducing contention currents in an interconnect multiplexer

A method of reducing power of a circuit is described. The method includes determining at least one unused selection input associated with stages of a multiplexer tree; pulling the at least one unused selection input to a constant value; and assigning predetermined values to unused data inputs of the multiplexer tree associated with the at least one unused selection input.

Method of reducing power of a circuit

An apparatus and method to accurately simulate negative bias and temperature instability (NBTI) and its effect. According to a first simulation method, a simulation netlist is automatically scanned for any P-type devices that are in a conductive state after application of an initial condition. Each conductive P-type device is automatically replaced with an NBTI device model and a first simulation cycle is executed. After the first cycle, each conductive P-type device is again replaced with an NBTI model and a second simulation cycle is executed. In a second simulation method, only those P-type devices transitioning from a non-conductive state to a conductive state are automatically replaced with an NBTI model prior to each half cycle of the second simulation method. The first simulation method provides robustness, while the second simulation method provides worst case verification in less time as compared to the first simulation method.

Method for simulation of negative bias and temperature instability

A method and apparatus is provided for the implementation of a process monitor vehicle (PMV) for memory cells. The memory cell PMV is useful in characterizing drive strength of the N-type and P-type field effect transistors (FETs) that are used to implement the memory cell. The memory cell PMV may be used, for example, to measure the amount of margin available for memory cell flips and how process variation affects the memory cell write margin. The memory cell PMV is implemented as a plurality of shift register bits interconnected as a ring oscillator, where each shift register bit is comprised of a memory cell. By adjusting the drive current for each memory cell and measuring the resultant change in oscillation frequency of the ring oscillator, information may be obtained concerning process variation and its effect on memory cell performance.

Process monitor vehicle

Method and apparatus for data monitoring for error detection is described. A programmable logic device includes a configurable logic block having function generators, each of which is configurable for at least two programmable mode functions. The function generators are coupled to an array of memory cells for storing configuration bits for configuring the function generators. A primary address line is coupled to each memory cell spanning two or more of the function generators. A secondary address line is coupled to groups of memory cells associated with the function generators. A mask circuit is configured to selectively communicate a signal of the primary address line to a segment of the secondary address line or to a ground responsive in part to the program mode function.

Data monitoring for single event upset in a programmable logic device

A programmable lookup table optionally provides two input signals and two output signals to an interconnect structure of a programmable integrated circuit when programmed to function as a random access memory (RAM). An integrated circuit includes an interconnect structure and a N-input lookup table (LUT) having input and output terminals coupled to the interconnect structure. The LUT can be configured to function as a single-bit wide RAM (e.g., a (2**N)&#xd7;1 RAM) having N input address signals coupled to the interconnect structure and one output signal coupled to the interconnect structure, or as a multi-bit wide RAM (e.g., a (2**(N&#x2212;1))&#xd7;2 RAM) having fewer than N (e.g., N&#x2212;1) input address signals coupled to the interconnect structure and at least two output signals coupled to the interconnect structure. Optionally, the LUT can also be configured as shift register logic, e.g., a 2**(N&#x2212;1)-bit shift register or two 2**(N&#x2212;2)-bit shift registers.

Programmable lookup table with dual input and output terminals in RAM mode

A programmable logic block provides programmable initialization values for carry chains traversing the logic block, without consuming user logic resources. An exemplary programmable logic block includes two or more carry multiplexers coupled together to form a carry chain for the programmable logic block. A carry initialization circuit has an output terminal coupled to a data input terminal of a first carry multiplexer in the carry chain. The carry initialization circuit is controlled by configuration memory cells of the programmable logic block to select one of a carry in signal, a power high signal, a ground signal, and (optionally) a signal from an interconnect structure of the logic block. Thus, an initialization value (e.g., power high or ground) can be provided to the carry chain without consuming other programmable resources within the logic block.

Programmable logic block providing carry chain with programmable initialization values

A programmable lookup table for an integrated circuit (IC) optionally provides two input signals and two output signals to an interconnect structure of the programmable IC when programmed to function as shift register logic. According to one embodiment, an integrated circuit includes an interconnect structure and a N-input lookup table (LUT) having input and output terminals coupled to the interconnect structure, where N is a integer. The LUT can be configured to function as a (2**(N&#x2212;1))-bit shift register having a shift in input signal and one output signal coupled to the interconnect structure, or as a two (2**(N&#x2212;2))-bit shift registers having two shift in input signals and two output signals coupled to the interconnect structure. In some embodiments, each bit of the shift register includes two memory cells of the LUT, a first memory cell functioning as a master latch and a second memory cell functioning as a slave latch.

Programmable lookup table with dual input and output terminals in shift register mode

One or more configurable transceivers can be fabricated on an integrated circuit. The transceivers contain various components having options that can be configured by turning configuration memory cells on or off. The integrated circuit may also contain programmable fabric. Other components in the transceivers can have options that are controlled by the programmable fabric. The integrated circuit may also contain one or more processor cores. The processor core and the transceivers can be connected by a plurality of signal paths that pass through the programmable fabric.

High speed configurable transceiver architecture

A test circuit to test rise delay/fall delay performance on a semiconductor device may comprise a latch to latch data at its input responsive to a clock signal. The latch may source an output signal related to the data latched. A buffer chain may be configured to serially propagate the signal sourced by the latch from the latch output back to the clock input, as the clock signal. A reset/set input of the latch may be configured to receive a reset/set signal from an intermediate node of the buffer chain.

Method of measuring performance of a semiconductor device and circuit for the same

Method and apparatus for regulating voltage within an integrated circuit is described. For example, a voltage regulator receives a first reference voltage and produces a regulated voltage. A comparator includes a first input for receiving a second reference voltage and a second input for receiving the regulated voltage. The comparator includes an offset voltage. The comparator produces a control signal indicative of whether the difference between the second reference voltage and the regulated voltage is greater than a predetermined offset voltage. A clamp circuit clamps the regulated voltage to the second reference voltage in response to the control signal. In another example, the clamp circuit is removed and a multiplexer selects either a first reference voltage or a second reference voltage to be coupled to a voltage regulator. The multiplexer is controlled via output of a comparator that compares the first reference voltage and the second reference voltage.

Method and apparatus for voltage regulation within an integrated circuit

Circuits that can be optionally programmed to function as lookup tables (LUTs) or wide multiplexers, and integrated circuits including these programmable circuits. A function select multiplexer is included between each memory cell and the corresponding data input terminal of a first multiplexer. Each function select multiplexer has a first data input terminal coupled to the corresponding memory cell, a second data input terminal coupled to an external input terminal, and a select terminal controlled by a value stored in a function select memory cell. When a first value is stored in the function select memory cell, the programmable circuit functions in the same fashion as a known LUT. When a second value is stored in the function select memory cell, the programmable circuit functions as a wide multiplexer, with the data input values being provided by the external input terminals.

Programmable circuit optionally configurable as a lookup table or a wide multiplexer

A programmable logic device (PLD) is provided that supports multi-gigabit transceivers (MGTs). The PLD includes one or more pairs of shared clock pads for receiving one or more high-quality differential clock signals. Dedicated clock traces couple each pair of shared clock pads to one or more MGTs on the PLD. Each MGT includes a clock multiplexer circuit, which allows one of the high-quality differential clock signals to be routed as a reference clock signal for the MGT. The clock multiplexer circuits are designed such that no significant jitter is added to the high-quality clock signals. The clock multiplexer circuits can also route general-purpose clock signals received by the PLD as lower quality reference clock signals for the MGTs. The reference clock signal routed by the clock multiplexer circuit can be stepped down to provide a reference clock for a physical coding sublayer of the MGT.

Low jitter clock for a physical media access sublayer on a field programmable gate array

A memory device having single event upset (SEU) resistant circuitry includes a first inverter having an input and an output, a second inverter having an input and an output, a first transistor having a gate coupled to the input of the first inverter and having source and drain regions coupled to the output of the second inverter, and a second transistor having a gate coupled to the input of the second inverter and having source and drain regions coupled to the output of the first inverter.

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San Jose, CA, United States of America

Philip D Costello