Growing community of inventors

Ellicott City, MD, United States of America

Mu-San Chen

Average Co-Inventor Count = 5.03

ph-index = 7

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 395

Mu-San ChenJeffrey M Calvert (8 patents)Mu-San ChenWalter J Dressick (4 patents)Mu-San ChenRanganathan Shashidhar (4 patents)Mu-San ChenJoel M Schnur (3 patents)Mu-San ChenBanahalli R Ratna (3 patents)Mu-San ChenTerrence G Vargo (3 patents)Mu-San ChenElizabeth Ann Dobisz (2 patents)Mu-San ChenJacque H Georger, Jr (2 patents)Mu-San ChenGary S Calabrese (2 patents)Mu-San ChenJoseph A Gardella (2 patents)Mu-San ChenCharles S Dulcey (2 patents)Mu-San ChenSusan L Brandow (2 patents)Mu-San ChenBrian M Peek (2 patents)Mu-San ChenJohn F Bohland (2 patents)Mu-San ChenRenate J Crawford (2 patents)Mu-San ChenKirsten A Grueneberg (1 patent)Mu-San ChenMu-San Chen (10 patents)Jeffrey M CalvertJeffrey M Calvert (32 patents)Walter J DressickWalter J Dressick (36 patents)Ranganathan ShashidharRanganathan Shashidhar (12 patents)Joel M SchnurJoel M Schnur (35 patents)Banahalli R RatnaBanahalli R Ratna (34 patents)Terrence G VargoTerrence G Vargo (16 patents)Elizabeth Ann DobiszElizabeth Ann Dobisz (34 patents)Jacque H Georger, JrJacque H Georger, Jr (16 patents)Gary S CalabreseGary S Calabrese (11 patents)Joseph A GardellaJoseph A Gardella (9 patents)Charles S DulceyCharles S Dulcey (6 patents)Susan L BrandowSusan L Brandow (3 patents)Brian M PeekBrian M Peek (3 patents)John F BohlandJohn F Bohland (3 patents)Renate J CrawfordRenate J Crawford (3 patents)Kirsten A GruenebergKirsten A Grueneberg (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. USA As Represented by Secretary of the Navy (8 from 16,070 patents)

2. Geo-centers, Inc. (6 from 45 patents)

3. Shipley Company LLC (2 from 522 patents)


10 patents:

1. 6773865 - Anti-charging layer for beam lithography and mask fabrication

2. 6586158 - Anti-charging layer for beam lithography and mask fabrication

3. 6156232 - Liquid crystal composition and alignment layer

4. 5976284 - Patterned conducting polymer surfaces and process for preparing the same

5. 5948316 - Liquid crystal composition and alignment layer

6. 5945486 - Fluoropolymeric substrates with metallized surfaces and methods for

7. 5696207 - Fluroropolymeric substrates with metallized surfaces and methods for

8. 5578351 - Liquid crystal composition and alignment layer

9. 5510216 - Selective metallization process

10. 5468597 - Selective metallization process

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as of
12/7/2025
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