Asmpt Singapore Pte. Ltd.

Asm Technology Singapore Pte Ltd

Mow Huat Goh

Keng Yew Song

Chi Kwan Park

Jiang Huang

Jian Min Chen

Zui Hong Lee

Ya Ping Zhu

Kien Kia Tan

Yam Mo Wong

A shear test is conducted on an interconnect bond formed on a surface of an electronic device by first determining a profile of the surface, and based on the determined profile, determining a shearing path which is at a substantially constant distance from the profile of the surface for a shear test tool to conduct the shear test on the interconnect bond. The shear test tool is then guided to move along the determined shearing path to measure a shear force of the interconnect bond.

Method and apparatus for conducting shear tests on interconnect bonds

An apparatus for calibrating a shear test tool utilizes a resilient pivot mechanism to improve accuracy and reliability of the force calibration. The apparatus includes a fixed element, a pivotable element configured to be rotatable relative to the fixed element, and a resilient pivot mechanism coupled between the fixed element and the pivotable element to form a pivot. The pivotable element is rotatable about the pivot to lift a weight coupled to the pivotable element when the shear test tool applies a force on the pivotable element in order to rotate the pivotable element and lift the weight.

Apparatus and method for calibrating a shear test tool

A height of a vertical wire interconnection bonded onto a substrate is measured by first capturing a top view of the vertical wire interconnection and identifying a position of a tip end of the vertical wire interconnection from the top view. A conductive probe is located over the tip end of the vertical wire interconnection, and is lowered towards the vertical wire interconnection until an electrical connection is made between the conductive probe and the tip end of the vertical wire interconnection. A contact height at which the electrical connection is made may thus be determined, wherein the contact height corresponds to the height of the vertical wire interconnection.

Method for measuring the heights of wire interconnections

A wire bonding method, comprising the steps of: extending a length of bonding wire from a capillary to form a wire tail; deforming a point on the wire tail to form a weakened portion between the wire tail and a remainder of the bonding wire retained within the capillary; and retracting at least a portion of the wire tail including the weakened portion into the capillary prior to bonding the wire tail to at least one of a bonding pad and a substrate.

Formation of bonding wire vertical interconnects

A method of forming a wire bond with a bonding tool is provided that comprises the steps of forming a ball bond onto a bonding surface, raising the bonding tool away from the ball bond to form a neck portion integrated with a top of the ball bond, locating a circumference of a tip of the bonding tool onto the neck portion, pressing the neck portion with the circumference of the tip to form a depression in the neck portion without bonding the neck portion to the ball bond, and thereafter raising the bonding tool away from the ball bond.

Growing community of inventors

Singapore, Singapore

Mow Huat Goh