Intel Corporation

Mohiuddin M Mazumder

Debendra Das Sharma

Zuoguo Wu

Jeff C Morriss

Mahesh U Wagh

Venkatraman Iyer

Kemal Aygun

Timothy D Wig

Jong-Ru Guo

Narasimha R Lanka

Anupriya Sriramulu

Sanjay Dabral

Zhichao Zhang

Mathew J Manusharow

Sanka Ganesan

Michael W Leddige

Mark B Trobough

Larry R Tate

Yu Zhang

Ven R Holalkere

Alok Tripathi

Hai-Feng Liu

Changhong Dai

Sourav Chakravarty

Dmitry Messerman

Dan Jiao

Yaakov Ben-Noon

Eli Chiprout

Pascal C Meier

An interconnect interface is provided to enable communication with an off-package device over a link including a plurality of lanes. Logic of the interconnect interface includes receiver logic to receive a valid signal from the off-package device on a dedicated valid lane of the link indicating that data is to arrive on a plurality of dedicated data lanes in the plurality of lanes, receive the data on the data lanes from the off-package device sampled based on arrival of the valid signal, and receive a stream signal from the off-package device on a dedicated stream lane in the plurality of lanes. The stream signal corresponds to the data and indicates a particular data type of the data. The particular data type can be one of a plurality of different data types capable of being received on the plurality of data lanes of the link.

Extending multichip package link off package

A device includes a receiver to receive one or more training sequences during a training of a link, where the link connects two devices. The device may include agent logic to determine, from the one or more training sequences, a number of extension devices on the link between the two devices, and determine that the number of extension devices exceeds a threshold number. The device may include a transmitter to send a plurality of clock compensation ordered sets on the link based on determining that the number of extension devices exceeds a threshold number.

High performance interconnect

A ground isolation webbing structure package includes a top level with an upper interconnect layer having upper ground contacts, upper data signal contacts, and a conductive material upper ground webbing structure that is connected to the upper ground contacts and surrounds the upper data signal contacts. The upper contacts may be formed over and connected to via contacts or traces of a lower layer of the same interconnect level. The via contacts of the lower layer may be connected to upper contacts of a second interconnect level which may also have such webbing. There may also be at least a third interconnect level having such webbing. The webbing structure electrically isolates and reduces cross talk between the signal contacts, thus providing higher frequency and more accurate data signal transfer between devices such as integrated circuit (IC) chips attached to a package.

Microprocessor package with first level die bump ground webbing structure

An assembly of substrate packages interconnected with flex cables. The assembly allows input/output (I/O) signals to be speedily transmitted between substrate packages via flex cable and without being routed through the motherboard. Embodiments relate to a substrate package providing detachable inter-package flex cable connection. The flex cable comprises a transmission region that includes a plurality of signal traces and a ground plane. A plurality of solder mask strips are disposed on the plurality of signals traces to provide anchoring for the signal traces. The solder mask strips intersect the signals traces. The exposed signal traces and the ground plane are coated with organic solderability preservative material. Hermetically-sealed guiding through holes are provided on the substrate package as a mechanical alignment feature to guide connection between flex cables and high speed I/O contact pads on the substrate package. Embodiments of the method of fabrication relate to simultaneously forming hermetically-sealed guiding through holes and I/O contact pads.

Flex cable and method for making the same

An electrical connector to be electrically disposed between a first circuit board and a second circuit board to electrically couple the first circuit board with the second circuit board is disclosed. The electrical connector may have an electro-optic modulator to modulate optical signals based on electrical signals exchanged between the first and second circuit boards through the electrical connector. Systems incorporating such electrical connectors, and methods of using the electrical connectors and systems, such as for debug, are also disclosed.

Circuit board-to-circuit board connectors having electro-optic modulators

An apparatus includes a printed circuit board (PCB) and a first flexible conductive cable ('flex cable') secured to the PCB. The apparatus also includes a daughter card having an end adjacent to the PCB and a second flex cable secured to the daughter card. The apparatus further includes a connector which provides an electrically conductive connection between the first flex cable and the second flex cable. The connector is positioned to sandwich a portion of the first flex cable between the connector and the PCB.

Technique for blind-mating daughtercard to mainboard

Embodiments of the present invention provide a method, apparatus and system for inductance modeling. According to some exemplary embodiments, a method for inductance modeling may include determining a plurality of two-dimensional mutual inductance values corresponding to a designated victim within a geometrical event and a plurality of designated attackers, respectively. Other embodiments are described and claimed.

Method, apparatus and system for inductance modeling in an electrical configuration

In one embodiment, an interconnect structure may be analyzed to determine electromagnetic characteristics of the structure by identifying structure seeds corresponding to the structure; modeling the structure seeds to obtain field patterns; and processing the field patterns to obtain the electromagnetic characteristics.

Analyzing interconnect structures

A semiconductor package substrate includes at least one insulative layer, at least two metal lines next to one another on a first side of the insulative layer, and a first metal layer on a second side of the insulative layer opposing the first side. An opening is formed in the first metal layer in an area between the metal lines. Two lands remain part of the first metal layer. The lands are located adjacent the opening and each land opposes a respective one of the metal lines located next to one another.

Hole geometry of a semiconductor package substrate

Growing community of inventors

San Jose, CA, United States of America

Mohiuddin M Mazumder