Other

Tsinghua University

Test Research, Inc.

Ming-Hwei Perng

Hung-Yin Tsai

Yen-Po Lin

Wen-Yih Isaac Tseng

Yen-Wen Huang

Wen-Yang Chiang

An automatic search system and a method for assisting a mobile apparatus to search for a matching device are provided. The automatic search method includes the following steps. First, N sets of consecutive images are captured at N time points respectively when the mobile apparatus moves along a first direction. The N is a positive integer greater than 1. Next, the N sets of consecutive images are received, and several image features of the N sets of images are compared, so as to determine accordingly whether the matching device exists in the first direction. If it is determined that the matching device exists, a route signal and an adjustment signal are generated. Next, according to the route signal, the mobile apparatus is controlled to move to an adjacent position of the matching device. Also, according to the adjustment signal, the mobile apparatus is controlled to be combined with the matching device.

Automatic search system and method

A method for measuring the thickness of a first absorbing material in the presence of a second absorbing material is provided. The method comprises the steps as follow. The thickness (t) of the first absorbing material is fixed and the thickness of the second absorbing material is varied to obtain a calibration standard. The intensity of the transmissive energy passing through the calibration standard is detected by acquiring multiple pairs of image data comprising a foreground value (log(I)) and a background value (log(I)). The thickness (t) of the first absorbing material is changed and the above steps are repeated to obtain sets of image data. A fitting constant Iis determined to describe each set of the intensity data as A best fit of the proportional constant is determined to further calculate an unknown thickness of the first absorbing material (t') through the equation 

Method for thickness calibration and measuring thickness of material

A q-space sampling method includes: (a) receiving a required sampling number and a range of sampling region in q-space set by a user; (b) obtaining a sampling interval by iteration using a regular non-rectangular sampling lattice when an actual sampling number converges to the required sampling number; and (c) obtaining positions of sampling data in q-space based on the sampling interval and the regular non-rectangular sampling lattice. A diffusion spectrum imaging method using the q-space sampling method is also disclosed.

Q-space sampling method and diffusion spectrum imaging method employing the same

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Hsinchu, Taiwan

Ming-Hwei Perng