Synopsys, Inc.

Mihir Sherlekar

Mayukh Bhattacharya

Antony Fan

A method of evaluating sampling sizes for circuit simulation comprises generating a plurality of coverage scenarios based on a defect universe, determining a coverage amount for each of the plurality of coverage scenarios, and associating the plurality of coverage scenarios with a plurality of bins based on the coverage amount for each of the plurality of coverage scenarios. The method further comprises sampling, with a first sampling size, each of the coverage scenarios to determine first sampled coverage scenarios, and determining an error value for each of the plurality of coverage scenarios based on the coverage amount of each of the plurality of coverage scenarios and a coverage amount of a respective one of the first sampled coverage scenarios. Further, the method comprises generating, with a processor and for the first sampling size, a confidence score for each of the plurality of bins based on the error value for each of the plurality of coverage scenarios, and outputting the confidence score for each of the plurality of bins.

Growing community of inventors

Mountain View, CA, United States of America

Mihir Sherlekar