Numerical Technologies, Inc.

Synopsys, Inc.

Michael Sanie

Dipankar Pramanik

Christophe Pierrat

Yao-Ting Wang

Shao-Po Wu

Kent Richardson

Susan Jennifer Lippincott

The cost of making a mask set cost has been dramatically increasing due to demand for very small device sizes as well as higher chip complexity. Thus, users would like to minimize the total mask costs. Current logic synthesis tools can create mask designs based on IC characteristics, e.g. speed, area, and power consumption. Therefore, a method of providing a mask design that can be optimized for cost is described. This method includes accessing cells from a library, wherein each cell includes a mask cost metric. Additionally, the weightings of one or more parameters in a constraints listing can be determined. Of importance, at least one parameter relates to mask cost. At this point, logic synthesis can be performed on the design using both the cells and the constraints listing. Advantageously, the resulting synthesized design can be optimized for mask cost.

Mask cost driven logic optimization and synthesis

One embodiment of the present invention provides a system that applies resolution enhancement techniques (RETs) selectively to a layout of an integrated circuit. Upon receiving the layout of the integrated circuit, the system identifies a plurality of critical regions within the layout based on an analysis of one or more of, timing, dynamic power, and off-state leakage current. The system then performs a first set of aggressive RET operations on the plurality of critical regions. The system also performs a second set of less aggressive RET operations on other non-critical regions of the layout.

Selectively applying resolution enhancement techniques to improve performance and manufacturing cost of integrated circuits

Techniques for forming a design layout with phase-shifted features, such as an integrated circuit layout, include receiving information about a particular phase-shift conflict in a first physical design layout. The information indicates one or more features logically associated with the particular phase-shift conflict. Then the first physical design layout is adjusted based on that information to produce a second design layout. The adjustments rearrange features in a unit of the design layout to collect free space around a selected feature associated with the phase-shift conflict. With these techniques, a unit needing more space for additional shifters can obtain the needed space during the physical design process making the adjustment. The needed space so obtained allows the fabrication design process to avoid or resolve phase conflicts while forming a fabrication layout, such as a mask, for substantiating the design layout in a printed features layer, such as in an actual integrated circuit.

Conflict sensitive compaction for resolving phase-shift conflicts in layouts for phase-shifted features

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Menlo Park, CA, United States of America

Michael Sanie