Average Co-Inventor Count = 5.36
ph-index = 7
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Kla Tencor Corporation (8 from 1,787 patents)
2. Kla-tencor Technologies Corporation (2 from 641 patents)
3. Other (1 from 832,680 patents)
11 patents:
1. 9601393 - Selecting one or more parameters for inspection of a wafer
2. 9483819 - Contour-based array inspection of patterned defects
3. 9318395 - Systems and methods for preparation of samples for sub-surface defect review
4. 9310316 - Selecting parameters for defect detection methods
5. 9087367 - Determining design coordinates for wafer defects
6. 8669523 - Contour-based defect detection using an inspection apparatus
7. 8594823 - Scanner performance comparison and matching using design and defect data
8. 8135204 - Computer-implemented methods, carrier media, and systems for creating a defect sample for use in selecting one or more parameters of an inspection recipe
9. 8000922 - Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm
10. 7522664 - Remote live video inspection
11. 7345753 - Apparatus and methods for analyzing defects on a sample