University of Colorado

Zolo Technologies, Inc.

John Zink Company, LLC

Onpoint Technologies, LLC

Michael John Estes

Andrew D Sappey

Bernard Patrick Masterson

Garret R Moddel

Henrik Hofvander

Lee A Sutherland

Pei Huang

Blake J Eliasson

James Howell

Garrett Moddel

Jim Howell

David Owenby

Allen Molitoris

Atilio Jobson

David Giltner

Rod Harris

Andrewd Sappey

A tunable diode laser absorption spectroscopy (TDLAS) optical head includes a housing configured for attachment to a sight tube attached to a wall of a process chamber. The TDLAS optical head further includes optics within the housing for transmitting, receiving, or transmitting and receiving a laser beam within a process chamber through the sight tube. The TDLAS optical head further includes a photo sensor in the housing positioned to receive light emitted by combustion within the process chamber to which the housing is attached.

Method and apparatus for monitoring port blockage for TDLAS measurements in harsh environments

A method of monitoring blockage of a sight tube attached to a wall of a process chamber, the sight tube being operatively associated with a TDLAS optical head with a window between the sight tube and the TDLAS optical head. The method includes the steps of providing a photo sensor in the TDLAS optical head, the photo sensor being positioned to receive light emitted by a light emitting process within the process chamber. An emission signal produced by light emitted by the light emitting process within the process chamber being received by the photo sensor is monitored. A determination is made if the emission signal is degrading.

A method of monitoring combustion properties in an interior of a furnace is described. A beam of light is projected through a pitch optic including a pitch collimating lens residing outside the boiler interior. The pitch collimating lens projects the beam through a penetration into the boiler interior. The beam of light projected by the pitch collimating lens is reflected from at least one in-furnace retro-reflector, and received with a catch optic substantially identical to the pitch optic residing outside the boiler interior. The pitch optic and the catch optic may be embodied in the same pitch/catch optic. The pitch collimating lens may also be steered toward another of the at least one in-furnace retro-reflectors. Combustion properties may be calculated for each retro-reflector based on retro-reflector zones within the furnace.

In-furnace retro-reflectors with steerable tunable diode laser absorption spectrometer

A method of monitoring combustion properties in an interior of a boiler of the type having walls comprising a plurality of parallel steam tubes separated by a metal membrane. First and second penetrations are provided in the metal membrane between adjacent tubes on opposite sides of the boiler. A beam of light is projected through a pitch optic comprising a pitch collimating lens and a pitch relay lens, both residing outside the boiler interior. The pitch relay lens projects the beam through a penetration into the boiler interior. The beam of light is received with a catch optic substantially identical to the pitch optic residing outside the boiler interior. The strength of the collimated received beam of light is determined. At least one of the pitch collimating lens and the catch collimating lens may then be aligned to maximize the strength of the collimated received beam.

Method and apparatus for monitoring combustion properties in an interior of a boiler

A method of absorption spectroscopy to determine a rapidly variable gas parameter. The method includes transmitting light from a synchronization light source to a synchronization detector. The transmitted light is periodically interrupted by a moving mechanical part between the synchronization light source and synchronization detector. The output from the synchronization detector is used to generate a repeating time signal having variable phase delay. This signal is used to control the timing of laser spectroscopy wavelength scans. Multiple spectroscopic scans may be repeated at multiple selected time signal phase delay and the results averaged for each phase. Apparatus for implementing the above methods are also disclosed.

Time-synchronized TDLAS measurements of pressure and temperature in a gas turbine engine

A device including an input port configured to receive an input signal is described. The device also includes an output port and a structure, which structure includes a tunneling junction connected with the input port and the output port. The tunneling junction is configured in a way (i) which provides electrons in a particular energy state within the structure, (ii) which produces surface plasmons in response to the input signal, (iii) which causes the structure to act as a waveguide for directing at least a portion of the surface plasmons along a predetermined path toward the output port such that the surface plasmons so directed interact with the electrons in a particular way, and (iv) which produces at the output port an output signal resulting from the particular interaction between the electrons and the surface plasmons.

Surface plasmon devices

A varactor is configured with first and second conducting layers, spaced apart from one another such that a given voltage can be applied across the first and second conducting layers. Further, an insulator arrangement includes at least one insulator layer disposed between the first and second conducting layers, configured to cooperate with the first and second conducting layers to produce a charge pool which changes responsive to changes in the given voltage such that a device capacitance value between the first and second conducting layers changes responsive to the given voltage. The insulator arrangement can include one layer, two distinct layers or more than two distinct layers. One or more of the layers can be an amorphous material. A zero-bias voltage version of the varactor is also described.

Metal-insulator varactor devices

A hot electron transistor includes an emitter electrode, a base electrode, a collector electrode, and a first tunneling structure disposed and serving as a transport of electrons between the emitter and base electrodes. The first tunneling structure includes at least a first amorphous insulating layer and a different, second insulating layer such that the transport of electrons includes transport by means of tunneling. The transistor further includes a second tunneling structure disposed between the base and collector electrodes. The second tunneling structure serves as a transport of at least a portion of the previously mentioned electrons between the base and collector electrodes by means of ballistic transport such that the portion of the electrons is collected at the collector electrode. An associated method for reducing electron reflection at interfaces in a thin-film transistor is also disclosed.

Thin-film transistors based on tunneling structures and applications

An integrated circuit chip includes a formation of integrated layers configured to define at least one integrated electronic component. The integrated layers further define an integrated electron tunneling device, which includes first and second non-insulating layers spaced apart from one another such that a given voltage can be provided thereacross. The integrated electron tunneling device further includes an arrangement disposed between the first and second non-insulating layers and serving as a transport of electrons between and to the first and second non-insulating layers. The arrangement includes at least a first layer configured such that the transport of electrons includes, at least in part, transport by means of tunneling. The integrated electron tunneling device further includes an antenna structure connected with the first and second non-insulating layers, and the integrated electron tunneling device is electrically connected with the integrated electronic component.

Interconnected high speed electron tunneling devices

An assembly includes a first electrical circuitry for providing a first electrical signal containing data and a transmitting arrangement, connected with the first electrical circuitry, for receiving the first electrical signal and for converting the first electrical signal into an electromagnetic signal containing at least a portion of the data. The electromagnetic signal has a carrier frequency greater than 300 GHz. The assembly also includes a receiving arrangement for receiving the electromagnetic signal and for converting the electromagnetic signal into a second electrical signal containing at least some of the portion of the data, and a second electrical circuitry connected with the receiving arrangement and configured for receiving the second electrical signal.

Growing community of inventors

Longmont, CO, United States of America

Michael John Estes