Taiwan Semiconductor Manufacturing Comp. Ltd.

Mei Hsu Wong

Tze-Chiang Huang

Haohua Zhou

Sandeep Kumar Goel

Yun-Han Lee

Kai-Yuan Ting

Shereef Shehata

Hsin-Cheng Chen

Alan S Roth

Eric Soenen

Ying-Chih Hsu

Paul Ranucci

A method includes: extracting a first current profile model corresponding to a System on Chip (SOC) at a first design stage of the SOC; determining that a first design data of an Integrated Voltage Regulator (IVR) and the SOC pass a first co-simulation based on the extracted first current profile model; extracting a second current profile model corresponding to the SOC at a second design stage of the SOC, the second design stage being subsequent to the first design stage; refining the first design data of the IVR to generate a second design data of the IVR; determining that the second design data of the IVR and the SOC pass a second co-simulation based on the extracted second current profile model.

System on chip (SOC) current profile model for integrated voltage regulator (IVR) co-design

Electronic system level (ESL) design and verification of the present disclosure is utilized to provide an electronic simulation and modeling of function safety and fault management of an electronic device. A method for simulating a safety circuit includes providing an electronic architectural design to perform one or more functional behaviors of the electronic device in accordance with an electronic design specification. The method further includes modeling the safety circuit of the electronic architectural design and one or more other electronic circuits of the electronic architectural design that communicate with the safety circuit. The method further includes simulating, using the modeling, operation of the safety circuit while the electronic architectural design is performing the one or more functional behaviors. The method also includes determining whether the simulated operation of the safety circuit satisfies the electronic design specification.

Function safety and fault management modeling at electrical system level (ESL)

A plurality of semiconductor devices are arranged in a stack. Individual semiconductor devices within the stack are selected by an identity signal sent into the stack. The signal is compared within each stack to a unique stack identifier stored within each of the semiconductor devices and, when the signal is the same as the unique stack identifier, the semiconductor device is selected while, when the signal is not the same as the unique stack identifier, the semiconductor device remains within the default bypass mode.

Semiconductor device and method of manufacture

Systems, devices, and methods are described herein for measuring an impedance of a DUT using an integrated impedance measurement device. A system includes a plurality of measurement circuits, a FFT processor, and a controller. The measurement circuits are coupled to the DUTs. Each measurement circuit is configured to generate a clock signal for a respective DUT, detect a voltage of the respective DUT, and generate first voltage related data using the clock signal and the voltage. The FFT processor is coupled to the measurement circuits. The FFT processor is configured to convert the first voltage related data into second voltage related data using a fast Fourier transform for each measurement circuit. The controller is coupled to the measurement circuits and the FFT processor. The controller is configured to calculate an impedance using the second voltage related data for each measurement circuit and output the impedance to each DUT.

Integrated impedance measurement device and impedance measurement method thereof

A semiconductor device includes an analog voltage regulator and an integrated circuit module. The analog voltage regulator generates a regulated output voltage. The integrated circuit module generates an analog sense voltage based on the regulated output voltage and includes integrated circuit dies, a first sensor, second sensors, and a digital voltage offset controller (DVOC). The first sensor generates a digital reference voltage based on an analog reference voltage. The second voltage sensors detect voltages at predetermined locations on the integrated circuit dies. The DVOC generates a digital offset voltage substantially equal to the difference between the digital reference voltage and the voltage detected by a selected one of the second voltage sensors. The regulated output voltage is based on an unregulated input voltage, the analog sense voltage, and the digital offset voltage.

Semiconductor device including a voltage regulator and an integrated circuit module

A semiconductor structure includes a first substrate. A first die and a second die are disposed over the first substrate and are adjacent to one another. A plurality of first conductive bumps are disposed between the first substrate and the first die and between the first substrate and the second die. A second substrate is disposed below the first substrate. A plurality of second conductive bumps is disposed between the first substrate and the second substrate. An in-package voltage regulator (PVR) chip is disposed over the second substrate. A molding material is disposed over the first substrate and surrounds the first die, the second die, the plurality of first conductive bumps, the plurality of second conductive bumps, and the PVR chip.

Power delivery for multi-chip-package using in-package voltage regulator

A device for power estimation is disclosed. The device includes a transformer circuit coupled with a processing circuit and a transaction interface. The transformer circuit is configured to count performance activities executed in the processing circuit and to compare count values of the performance activities with a predetermined value to determine a power state of the processing circuit. The transaction interface is configured to receive a request from the processing circuit and record a first timestamp, and further configured to receive a response from a memory model and record a second timestamp, the transaction interface being further configured to record a time difference between the first timestamp and the second timestamp as a time difference. The transformer circuit is further configured to determine the power state of the processing circuit based on both of the count values and the time difference.

Power estimation

A System On Chip (SOC) current profile model for Integrated Voltage Regulator (IVR) co-design may be provided. A first current profile model may be extracted corresponding to an SOC at a first design stage of the SOC. Then it may be determined that an IVR and the SOC pass a first co-simulation based on the extracted first current profile model. Next, a second current profile model may be extracted corresponding to the SOC at a second design stage of the SOC. Then it may be determined that the IVR and the SOC pass a second co-simulation based on the extracted second current profile model. A third current profile model may be extracted corresponding to the SOC at a third design stage of the SOC. Then it may be determined that the IVR and the SOC pass a third co-simulation based on the extracted third current profile model.

A method is disclosed that includes providing an IP bank, an application bank, and a technology bank; generating a hierarchical table based on the IP bank and the application bank; performing an estimation of at least one of a performance value, a power value, an area value and a cost value, which corresponds to the hierarchical table, by using the technology bank, to output an result data as a basis of fabrication of a system.

System and method for system-level parameter estimation

A power state transformer, a system and a method thereof are disclosed. The power state transformer is coupled with a processing unit model. The power state transformer is configured for counting performance activities executed in the processing unit model, and further for determining a power state of the processing unit model according to count values of the performance activities.

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Saratoga, CA, United States of America

Mei Hsu Wong