Texas Instruments Corporation

Mary Ann Murphy

Louis N Hutter

John P Erdeljac

Jeffrey P Smith

Taylor R Efland

Han-Tzong Yuan

Jau-Yuann Yang

John Kenneth Arch

C Matthew Thompson

James D Goon

Shiu-Hang Yan

Arnold C Conway

Mark E Gibson

AnhKim Duong

Susan S Kearney

A power field effect transistor is disclosed that includes polysilicon gate bodies (,) and (,), which includes platinum silicide contact layers (,) and (,) disposed on the outer surfaces of bodies (,) and (,), respectively. In addition, the device comprises an n&plus;drain region (,) which also has a platinum silicide drain contact layer (,) formed on its outer surface and platinum silicide source contact layers (,) and (,). During formation, sidewall spacers (,) and (,), as well as mask bodies (,) and (,) are used to ensure that platinum silicide layer (,) spaced apart from both gate bodies (,) and (,) and platinum silicide gate contact layers (,) and (,).

Power transistor with silicided gate and contacts

An integrated circuit having PMOS, NMOS and NPN transistors is described for applications in which both digital and analog circuits are required. The integrated circuit is designed to allow standard CMOS cells to be used in the integrated circuit without redesign. A P+ substrate (48) is provided upon which a first P- epitaxy layer (46) is formed. N+ DUF regions (50,52) are provided for the PMOS and NPN transistors, respectively. The base region (68) is formed in an Nwell (58) by implantation and diffusion. Before diffusion, a nitride layer (70) is formed over the base (68) to provided an inert annealing thereof. The base diffusion and collector diffusion occurs before the CMOS channel stop and source/drain diffusions in order to prevent altering diffusion times for the MOS transistors.

High voltage merged bipolar/CMOS technology

Growing community of inventors

Richardson, TX, United States of America

Mary Ann Murphy