Average Co-Inventor Count = 3.86
ph-index = 14
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Disney Enterprises, Inc. (40 from 2,767 patents)
2. Mitsubishi Electric Research Laboratories, Inc. (8 from 1,631 patents)
3. Nvidia Corporation (6 from 5,406 patents)
4. Eth Zurich (eidgenoessische Technische Hochschule Zurich) (6 from 36 patents)
5. Eth Zurich (eidgenossische Technische Hochschule Zurich) (5 from 63 patents)
6. Hewlett-packard Development Company, L.p. (3 from 27,394 patents)
7. Eth Zurich (3 from 283 patents)
8. Dybuster Ag (3 from 3 patents)
9. Other (1 from 832,680 patents)
10. Technion Research & Development Foundation Limited (1 from 944 patents)
11. Pixar (1 from 349 patents)
12. Eidgenossische Technische Hochschule Zurich (1 from 59 patents)
13. Eth Zuerich (1 from 16 patents)
14. Swiss Federal Institute of Technology Zurich (1 from 4 patents)
15. Liberovision Ag (1 from 3 patents)
66 patents:
1. 11721081 - Virtual reality experience scriptwriting
2. 10970849 - Pose estimation and body tracking using an artificial neural network
3. 10817583 - Systems and methods for non-linear content creation
4. 10586399 - Virtual reality experience scriptwriting
5. 10491856 - Video frame interpolation using a convolutional neural network
6. 10483004 - Model-based teeth reconstruction
7. 10403404 - Physical face cloning
8. 10297065 - Methods and systems of enriching blendshape rigs with physical simulation
9. 10217265 - Methods and systems of generating a parametric eye model
10. 10217275 - Methods and systems of performing eye reconstruction using a parametric model
11. 9959664 - Adaptive polynomial rendering
12. 9843776 - Multi-perspective stereoscopy from light fields
13. 9786062 - Scene reconstruction from high spatio-angular resolution light fields
14. 9684953 - Method and system for image processing in video conferencing
15. 9623608 - Fabrication of materials with desired characteristics from base materials having determined characteristics