Thales Alenia Space Italia S.p.a. Con Unico Socio

Scuola Superiore Di Studi Universitari E Perfezionamento Sant' Anna

Mario Rannello

Fulvio Bresciani

Giulio Cossu

Ernesto Ciaramella

Valter Basso

Optical unit for a projective optical metrological system, which receives a light signal coming from a light constellation comprising a number of light sources; the optical unit includes: an optoelectronic image acquisition system and a first and a second optical circuit, which receive the light signal and are traversed by a first and a second optical beam, respectively. The first and the second optical circuits direct, respectively, at least a first part of the first optical beam and at least a first part of the second optical beam on the optoelectronic image acquisition system, so as to cause the simultaneous formation of two different images of the constellation in the optoelectronic image acquisition system. The optical unit further includes an electronic processing unit coupled to the optoelectronic image acquisition system, which determines a number of quantities indicative of the position and/or attitude of the light constellation with respect to the optical unit, based on the two images. The optical unit further includes an optical receiver and a derivation optical circuit configured to optically couple the optical receiver and at least one of the first and the second optical circuit, so that the optical receiver receives an optical information signal, which is a function of at least one of the first and the second optical beams. The optical receiver demodulates digital data from the optical information signal.

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Pisa, Italy

Mario Rannello