Micron Technology Incorporated

Mansour Fardad

Harish Naga Venkata

John Frederic Schreck

Brian W Huber

Roger D Norwood

Jeffrey Edward Koelling

Various embodiments comprise methods and related apparatuses formed from those methods for placing at least portions of peripheral circuits under a DRAM memory array, where the peripheral circuits are used to control an operation of the DRAM memory array. In an embodiment, a memory apparatus includes a DRAM memory array and at least one peripheral circuit formed under the DRAM memory array, where the at least one peripheral circuit includes at least one circuit type selected from sense amplifiers and sub-word line drivers. Additional apparatuses and methods are also disclosed.

Peripheral logic circuits under DRAM memory arrays

Apparatuses and methods related to memory arrays with separate global read and write lines and/or sense amplifier region column select lines are disclosed. An example apparatus includes first and second memory sections, and further includes a sense amplifier region. A memory section includes a word line extending in a first direction and a digit line extending in a second direction, and the sense amplifier region is disposed between the first and second memory sections. The sense amplifier region includes a sense amplifier coupled to the digit line, a local input/output (LIO) line, a column select circuit coupled to the sense amplifier, and a column select line. The column select line extends in the first direction and is configured to provide a column select signal to the column select circuit. Capacitance of a LIO line may be reduced by coupling fewer sense amplifiers of a group to the LIO line.

Apparatuses including a memory array with separate global read and write lines and/or sense amplifier region column select line and related methods

Apparatuses and methods for memory arrays with separate global read and write lines and/or sense amplifier region column select lines are disclosed. An example apparatus includes first and second memory sections, and further includes a sense amplifier region. A memory section includes a word line extending in a first direction and a digit line extending in a second direction, and the sense amplifier region is disposed between the first and second memory sections. The sense amplifier region includes a sense amplifier coupled to the digit line, a local input/output (LIO) line, a column select circuit coupled to the sense amplifier, and a column select line. The column select line extends in the first direction and is configured to provide a column select signal to the column select circuit. Capacitance of a LIO line may be reduced by coupling fewer sense amplifiers of a group to the LIO line.

A DRAM memory device having two sets of power buses is provided. Each set includes a first bus having a first potential and a second bus having a second potential, both of which are required to activate a row of memory within a bank of memory. A first row is activated while it is connected to the first set of buses. If it is detected that the activation of a second row connected to the first set of buses will cause a power bump when it is time to deactivate the first row, the first row is switched over to the second set of buses prior to the activation of the second row. The first row can be precharged with the voltages from the second set of buses and the second row can be activated with the voltages from the first set of buses. Thus, the first row can be precharged without being adversely effected by the power bump on the first set of buses which improves the pause performance of the DRAM.

Growing community of inventors

Allen, TX, United States of America

Mansour Fardad