International Business Machines Corporation

Samsung Electronics Co., Ltd.

Luqiao Liu

Daniel Christopher Worledge

Jonathan Zanhong Sun

Guohan Hu

John De Brosse

Younghyun Kim

Jeong-Heon Park

Kwangseok Kim

Junghyuk Lee

A magneto-resistance random access memory (MRAM) cell includes a transistor, a wire and a magnetic tunnel junction (MTJ). The MTJ includes a fixed layer of fixed magnetic polarity electrically connected with the transistor, a free layer of variable magnetic polarity electrically connected with the wire and an insulator between the fixed and free layers. First current passed through the wire destabilizes the variable magnetic polarity of the free layer. Second current passed through the transistor in one of two directions during first current passage through the wire directs the variable magnetic polarity of the free layer toward a parallel or anti-parallel condition with respect to the fixed magnetic polarity of the fixed layer. A ceasing of the first current prior to a ceasing of the second current sets the variable magnetic polarity of the free layer in the parallel or anti-parallel condition.

Spin hall write select for magneto-resistive random access memory

Techniques relate to forming a magnetic tunnel junction (MTJ). A magnetic reference layer is formed adjacent to a tunnel barrier layer. The magnetic reference layer includes a pinned layer, a spacer layer adjacent to the pinned layer, and a polarizing enhancement layer adjacent to the spacer layer. A magnetic free layer is formed adjacent to the tunnel barrier layer so as to be opposite the magnetic reference layer.

High temperature endurable MTJ stack

Magnetic memory devices having an antiferromagnetic reference layer based on Co and Ir are provided. In one aspect, a magnetic memory device includes a reference magnetic layer having multiple Co-containing layers oriented in a stack, wherein adjacent Co-containing layers in the stack are separated by an Ir-containing layer such that the adjacent Co-containing layers in the stack are anti-parallel coupled by the Ir-containing layer therebetween; and a free magnetic layer separated from the reference magnetic layer by a barrier layer. A method of writing data to a magnetic random access memory device having at least one of the present magnetic memory cells is also provided.

Spin torque MRAM based on Co, Ir synthetic antiferromagnetic multilayer

Embodiments are directed to using an anomalous hall effect (AHE) or a polarized spin hall effect (PSHE) to switch a magnetic moment of a free layer having perpendicular magnetic anisotropy (PMA). AHE/PSHE includes materials with spontaneous magnetic moment. Thus, the spin orientation generated by AHE/PSHE not only depends upon the geometrical orientation, but also on the magnetic moment orientation of the AHE/PSHE material. Therefore, out-of-plane polarized spins are injected into the magnetic free layer, and the corresponding spin current switches the magnetic moment of a magnetic free layer with PMA through the anti-damping mechanism. In some embodiments, an asymmetric bottom lead may be used, such that a tunneling current flows toward one side after it leaves the free layer.

Utilization of the anomalous hall effect or polarized spin hall effect for MRAM applications

Embodiments are directed to providing a spin hall effect (SHE) assisted spin transfer torque magnetic random access memory (STT-MRAM) device by coupling a magnetic tunnel junction (MTJ) to a SHE material, and coupling the SHE material to a transistor. Embodiments are directed to a spin transfer torque magnetic random access memory (STT-MRAM) device comprising: a magnetic tunnel junction (MTJ) coupled to a spin hall effect (SHE) material, and a transistor coupled to the SHE material.

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Yorktown Heights, NY, United States of America

Luqiao Liu