Texas Instruments Corporation

Lucius Marshall Sherwin

Noppawan Boorananut

Ronald Charles Roth

Jesse Yuan

Sean Christopher O'Brien

Timothy J Hogan

Jose Antonio Martinez

Song Zheng

Rosemary Urmese Anthraper

Irma Izzeth Annillo

Chris Murray Beard

A method includes forming a first aluminum silicon layer on a metal layer and forming a titanium nitride layer (or other titanium-based layer) on a surface of the aluminum-silicon layer opposite the metal layer. The method further includes etching the titanium nitride layer to create a titanium nitride pad and forming a torsion hinge in the metal layer. The titanium nitride pad is on the torsion hinge. The method also includes depositing a sacrificial layer over the torsion hinge and titanium nitride pad, forming a via in the sacrificial layer from a surface of the sacrificial layer opposite the torsion hinge to the titanium nitride pad, depositing a metal mirror layer on a surface of the sacrificial layer opposite the torsion hinge and into the via, and removing the sacrificial layer.

Mirror via conductivity for DMD pixel

Methods and apparatus to control grayscale lithography are disclosed. A disclosed example apparatus for adjusting a grayscale lithography process includes an optical measurement device to optically measure portions of a patterned wafer, and a processor to calculate a profile based on the measured portions, and to determine an adjustment of the grayscale lithography process based on the calculated profile. The disclosed apparatus also includes an adjuster to control the grayscale lithography process based on the adjustment.

Methods and apparatus to control grayscale photolithography

A microelectromechanical (MEMS) device has a movable member supported above a substrate on a via support. The member and via support are fabricated integrally from first and second member forming layers. A first member forming layer forms a lower part of the member and supporting structure for the via support. First and second fill layers are deposited and patterned to form a plug that fills an inner cavity opening in the via structure. The plug is planarized to a planar part of the first member forming layer, and a second member forming layer is deposited over the first member forming layer and the planarized plug to form an upper part of the member. The via support may have a cavity filled by BARC layers.

MEMS device with improved via support planarization

A method of forming an electronic device includes providing a patterned lower metal layer over a substrate and a first sacrificial layer there between. A second sacrificial layer is formed over the metal layer, and a portion thereof is removed. A third sacrificial layer is formed over the second sacrificial layer, and an upper metal layer is formed over the third sacrificial layer. A portion of the upper metal layer is removed, and the first, second and third sacrificial layers are removed.

Planarity of pixel mirrors

System and method for maximizing image quality by eliminating vias on a reflective surface. A preferred embodiment comprises depositing a first portion of a mirror surface over a support surface, applying a protective coating on the mirror surface, and then inverting the via. The preferred embodiment also comprises removing a portion of the inverted via and then depositing a second portion of the mirror surface. The remaining portion of the inverted via fills the via and provides a level surface for the depositing of the second portion of the mirror surface, reducing the amount of light scattered by the via.

System and method for increasing image quality in a display system

A portable particle detection and removal system ( ) that connects to a house vacuum ( ). A particle sensor ( ) is connected between two hoses: one ( ) connected to the house vacuum ( ) and one ( ) for vacuuming the wafer equipment chamber. A smaller diameter hose ( ) may be used for vacuuming the wafer equipment chamber. The particle sensor detects ( ) incoming particles and a particle count is displayed for the operator. A modulated cleaning system ( ) modulates the vacuum pressure in the second hose ( ) between two vacuum pressure states.

Growing community of inventors

Plano, TX, United States of America

Lucius Marshall Sherwin