Siliconware Precision Industries Co., Ltd.

Lien-Chen Chiang

Chin-Yuan Hung

Wei-Sheng Lin

Yude Chu

Hung-Wen Liu

Ya-Yi Lai

Wen-Shan Tsai

Cheng-Shiu Hsiao

Lung-Tang Hung

Meng-Hung Yeh

Chien-Feng Wei

Ming Cheng Lin

A method of eliminating a defective bonding wire is provided, including moving a bonding member from a first region of a carrier to a second region of the carrier if the bonding wire of the bonding member is defective, and cooperatively operating a movement member and the bonding member so as to cause the defective bonding wire to be removed from the bonding member and bonded to the second region of the carrier, thereby auto-debugging the bonding member and improving the production efficiency.

Wire bonding device and method of eliminating defective bonding wire

A lead frame structure is provided, which includes a die pad having a first mounting portion and a second mounting portion separated from the first mounting portion by a gap. The first and second mounting portions are formed with corresponding blocking surfaces bordering the gap, so as to allow a flow rate of an encapsulating resin flowing through the gap during a molding process to be reduced by the blocking surfaces, such that different portions of the encapsulating resin respectively flowing above, in and below the die pad can have substantially the same flow rate, thereby preventing bonding wires from being deformed to cause short circuit and avoiding formation of voids. A semiconductor package with the lead frame structure is also provided.

Lead frame structure having blocking surfaces and semiconductor package integrated with the lead frame structure

A lead frame for improving molding reliability and a semiconductor package with the lead frame are proposed. At least one embossed structure, such as a metal bump or recessed portion, is formed on a bonding layer of a wire-bonding area of the lead frame. At least one semiconductor chip is electrically connected to the lead frame via bonding wires bonded to the bonding layer. During a molding process for fabricating an encapsulant to encapsulate the chip, the bonding wires and a portion of the lead frame, the embossed structure makes the bonding layer become uneven and thus increases the contact area and adhesion between the bonding layer and the encapsulant, so as to prevent cracks of the bonding wires and improve the electrical performances and molding reliability.

Lead frame for improving molding reliability and semiconductor package with the lead frame

A package structure having tapering support bars and leads. The package structure has at least a lead frame, a die, a plurality of conductive wires and an encapsulating plastic body. The lead frame has a first surface and has at least a package unit. The package unit has a die pad, a plurality of leads and a plurality of support bars. The die pad is positioned in the middle. The leads and support bars are distributed around the periphery of the package unit. In addition, the width of the leads and support bars decreases gradually from a location close to the die pad towards the peripheral region. The leads and support bars have a rectangular or trapezoidal cross-section. A die is bonded on the surface of the die pad and the die is electrically connected to the leads on the lead frame via a plurality of conductive wires. Plastic material such as epoxy resin encloses the die, the conductive wires and the first surface of the lead frame.

Package structure having tapering support bars and leads

A semiconductor package for chip with testing contact pad includes a chip, a plurality of leads, at least a flow-conducting plate, and a molding compound. The chip has an active surface provided with a plurality of functional contact pads and at least a testing contact pad. The leads are bonded onto the active surface of the chip and respectively connected to the functional contact pads through a plurality of functional wires. The flow-conducting plate is connected to the testing contact pad through at least a testing wire. The molding compound encapsulates the chip, the leads, the flow-conducting plate, the functional contact pads, and the testing contact pads.

Semiconductor package for chip with testing contact pad connected to outside

A quad flat non-leaded package structure for housing a sensor. The package includes a die pad, a plurality of leads, a die, a plurality of bonding wires, a packaging plastic body and a lid cover. A plurality of supporters are formed near the edges on the backside of the die pad. The plurality of leads is positioned at a well-defined distance away from the four sides of the die pad. The packaging plastic body is formed on the upper surface near the peripheral section of the leads. The space between the die pad and the leads is filled by the packaging plastic material but the bottom section of the leads and the bottom section of the supporters on the backside of the die pad are exposed. The die is attached to the upper surface of the die pad and is electrically connected to the leads using the bonding wires. The lid cover is placed over the packaging plastic body.

Growing community of inventors

Taichung, Taiwan

Lien-Chen Chiang