Growing community of inventors

Parker, TX, United States of America

Lee Doyle Whetsel

Average Co-Inventor Count = 1.06

ph-index = 32

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 4,723

Lee Doyle WhetselBaher S Haroun (31 patents)Lee Doyle WhetselRichard L Antley (20 patents)Lee Doyle WhetselAlan David Hales (14 patents)Lee Doyle WhetselBrian J Lasher (13 patents)Lee Doyle WhetselJayashree Saxena (9 patents)Lee Doyle WhetselAnjali Vij (8 patents)Lee Doyle WhetselJoel J Graber (7 patents)Lee Doyle WhetselAnjali Kinra (5 patents)Lee Doyle WhetselBenjamin H Ashmore, Jr (3 patents)Lee Doyle WhetselLee Doyle Whetsel (859 patents)Baher S HarounBaher S Haroun (214 patents)Richard L AntleyRichard L Antley (20 patents)Alan David HalesAlan David Hales (25 patents)Brian J LasherBrian J Lasher (13 patents)Jayashree SaxenaJayashree Saxena (14 patents)Anjali VijAnjali Vij (8 patents)Joel J GraberJoel J Graber (13 patents)Anjali KinraAnjali Kinra (5 patents)Benjamin H Ashmore, JrBenjamin H Ashmore, Jr (19 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Texas Instruments Corporation (856 from 29,103 patents)

2. Other (2 from 832,347 patents)

3. Texas Instruments Incororated (1 from 1 patent)


859 patents:

1. 12416670 - Falling clock edge JTAG bus routers

2. 12379393 - Testing interposer method and apparatus

3. 12352814 - Interposer circuit

4. 12313667 - Integrated circuit die test architecture

5. 12210060 - Device access port selection

6. 12188980 - Test access port with address and command capability

7. 12181521 - At-speed test access port operations

8. 12164001 - 3D tap and scan port architectures

9. 12163998 - TSV testing

10. 12153090 - Commanded JTAG test access port operations

11. 12154835 - Scan testable through silicon VIAs

12. 12146909 - Selectable JTAG or trace access with data store and output

13. 12130328 - Interface to full and reduced pin JTAG devices

14. 12117490 - Scan frame based test access mechanisms

15. 12092687 - Selectable JTAG or trace access with data store and output

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as of
10/2/2025
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