Hong Kong Applied Science and Technology Research Institute Company, Limited

Kwok Kuen David Kwong

Yat To William Wong

Ho Ming Karen Wan

Chik Wai David Ng

Kam Chuen Wan

Kwai Chi Chan

Chun Fai Wong

Yat Tung Lai

Hing Kit Kwan

Kam Hung Chan

Hok Mo Yau

Xiao Fei Kuang

Lap Chi David Leung

Wai Kit Victor So

Tin Ho Andy Wu

A charge/discharge protection circuit protects a battery from inadvertent shorting on a charger node that can connect to a charger or to a power supply of a portable electronic device. A single n-channel power transistor has a gate that controls a channel between the battery and the charger node. The gate is connected to the charger node by a gate-coupling transistor to turn off the power transistor, providing battery isolation. The gate is driven by a voltage-boosted clock through a switch activated by an enable signal. The enable signal also activates a grounding transistor to ground a gate of the gate-coupling transistor. A comparator compares voltages of the charger and battery nodes, and the compare output is latched to generate the enable signal. An inverse enable signal activates a second switch that drives the voltage-boosted clock to the gate of the gate-coupling transistor to turn off the power transistor.

Single-power-transistor battery-charging circuit using voltage-boosted clock

A motor driver circuit for driving the gate node of a high-side driver transistor to a boosted voltage from a charge pump draws little or no static current from the charge pump. The gate node is pulled to the boosted voltage by a p-channel pullup-control transistor that is driven by p-channel transistors that are pumped by capacitors that cut off current flow to ground from the charge pump. An n-channel output-shorting transistor shorts the gate node to the output when the high-side driver is turned off. A coupling capacitor initializes the shorting transistor for each output transition. A p-channel output-sensing transistor generates a feedback to a second stage that drives the coupling capacitor. P-channel diode transistors and an n-channel equalizing transistor control the voltage on the coupling capacitor.

Bootstrapped high-side driver control without static DC current for driving a motor bridge circuit

An electro-static-discharge (ESD) protection circuit protects core transistors. An internal node to the gate of an n-channel output transistor connects to the drain of an n-channel gate-grounding transistor to ground. The gate of the gate-grounding transistor is a coupled-gate node that is coupled by an ESD coupling capacitor to the output and to ground by an n-channel disabling transistor and a leaker resistor. The gate of the n-channel disabling transistor is connected to power and disables the ESD protection circuit when powered. An ESD pulse applied to the output is coupled through the ESD coupling capacitor to pulse high the coupled-gate node and turn on the gate-grounding transistor to ground the gate of the n-channel output transistor, which breaks down to shunt ESD current. The ESD pulse is prevented from coupling through a parasitic Miller capacitor of the n-channel output transistor by the gate-grounding transistor.

ESD protection using a capacitivly-coupled clamp for protecting low-voltage core transistors from high-voltage outputs

A hybrid Analog-to-Digital Converter (ADC) has a binary-weighted capacitor array and a sub-voltage capacitor array that are coupled together by a coupling capacitor. The sub-voltage capacitor array uses a minimum capacitor size that matches the minimum capacitor size of the binary-weighted capacitor array. The coupling capacitor is double the minimum size and reduces a voltage effect on a charge sharing line by half. Second coupling capacitors in the sub-voltage capacitor array each reduce the voltage effect by half, so that first, second, and third sub-voltage capacitors in the sub-voltage capacitor array produce &#xbd;, &#xbc;, and &#x215b; voltage swings using the minimum size capacitance. Only MSB capacitors in the binary-weighted capacitor array sample the analog input voltage. During conversion, MSB's from a Successive-Approximation-Register (SAR) are applied to binary-weighted capacitors while LSB's are applied to sub-voltage capacitors. The total capacitance is reduced by applying the LSB's only to the sub-voltage capacitor array.

Hybrid analog-to-digital converter (ADC) with binary-weighted-capacitor sampling array and a sub-sampling charge-redistributing array for sub-voltage generation

An error amplifier can be used to control a power regulator transistor. The error amplifier has a main amplifier, a pull-up auxiliary amplifier, and a pull-down auxiliary amplifier that all drive an output. A compensating capacitor on the output sets a single dominant pole for all amplifiers, increasing stability. High slew rates are provided by increased slew current from the auxiliary amplifiers that turn on when the differential input has an absolute voltage difference larger than an intentional offset. The intentional offset is introduced into the auxiliary amplifiers by adjusting a p-channel to n-channel transistor ratio in a leg of the auxiliary amplifiers. A source degenerated resistor in the main amplifier reduces supply headroom and increases linearity by connecting sources of two differential transistors that receive the differential input. Cascode transistors increase gain and output impedance. Reliability is increased as no positive feedback is used in the amplifiers.

Slew-rate-enhanced error amp with adaptive transconductance and single dominant pole shared by main and auxiliary amps

An Analog-to-Digital Converter (ADC) has a Successive-Approximation-Register (SAR) driving a digital-to-analog converter (DAC) that generates an analog voltage compared to an input voltage by a series of stages. The last stage feeds a compare signal to the SAR. Each stage has a dual-input differential amplifier that operates as a unity gain op amp during an auto-zeroing phase and as a high-speed low-gain amplifier during an amplifying phase. The dual-input differential amplifier has two pairs of differential inputs. A secondary pair has an offset-storing capacitor across it, and connects to the output pair through feedback switches during auto-zeroing. A primary pair connects to stage inputs through input switches during the amplifying phase. Since two pairs of differential inputs are provided to the dual-input differential amplifier, the offset capacitor is completely isolated from the input pair. The current sink in the dual-input differential amplifier is adjusted higher during the amplifying period.

Multi-stage comparator with offset canceling capacitor across secondary differential inputs for high-speed low-gain compare and high-gain auto-zeroing

A re-configurable circuit acts as an Analog-to-Digital Converter (ADC) and as a digital-to-analog converter (DAC). An array of binary-weighted capacitors stores an analog input. Switches connect different capacitors in the array to fixed voltages that cause charge-sharing with a terminal capacitor. The voltage of the terminal capacitor is compared by a re-configurable comparator stage for each different combination of the capacitors. The comparison results are analyzed to determine the closest digital value for the analog input. In DAC mode, the array capacitors are switched based on an input digital value. The switched capacitors connect to a charge-sharing line to generate an analog voltage that is applied to the re-configurable comparator stage. A differential amplifier generates a buffered analog voltage that is fed back to the other input of the re-configurable comparator stage for unity gain. The gain of the re-configurable comparator stage adjusts for ADC and DAC modes.

Dual-use comparator/op amp for use as both a successive-approximation ADC and DAC

A power converter has a power transistor driving a power current through an inductor to provide a controlled power-supply voltage. The power transistor is on during a first state but off during a second state when a sink transistor reduces the power current through the inductor. Both voltage sensing of the power-supply voltage and current sensing at the power transistor provide feedback to control the amount of time that the first state is active, and thus control the power current. Current sensing is provided by a smaller minor transistor in parallel with the power transistor. The minor transistor turns on after the power transistor to reduce disturbance spikes. Switches connect sources of the power and mirror transistors to an amplifier that drives a sensing transistor. The sensing transistor generates a sensing voltage from the mirror transistor source. During the second state the amplifier's inputs are equalized to provide fast response.

Current-mode-controlled current sensor circuit for power switching converter

A bandgap reference voltage generator has a first stage that generates a first current that is complementary-to-absolute-temperature (Ictat) and a second stage that generates a current that is proportional-to-absolute-temperature (Iptat). The Ictat and Iptat currents are both forced through a summing resistor to generate a voltage that is relatively independent of temperature, since the Ictat and Iptat currents cancel out each other's temperature dependencies. A PMOS output transistor drives current to an output load to maintain the load at the reference voltage. An op amp drives the gate of the PMOS output transistor and has inputs connected to emitters of PNP transistors in the second stage. A series of resistors generate the reference voltage between the PMOS output transistor and ground and drives bases of the PNP transistors and includes the summing resistor. Parasitic PNP transistors in an all-CMOS process are used. The generator operates with a 1-volt power supply.

Low voltage high-output-driving CMOS voltage reference with temperature compensation

An oscillator operates at a very low voltage yet has a duty cycle that is set by a ratio of capacitors that are charged and discharged. Sub-threshold p-channel transistors conduct sub-threshold currents below the normal threshold voltage, and drive set and reset inputs of a set-reset S-R latch. The S-R latch drives the oscillator outputs. The oscillator outputs feed back to charging p-channel transistors that charge one plate of the capacitors. During half of the cycle, the charging p-channel transistor is off, allowing one plate of the capacitors to discharge through an n-channel discharge transistor. After a period of discharge determined by the capacitance of the capacitor, the gate of a sub-threshold p-channel transistor falls enough for sub-threshold current to flow, triggering the set or reset input of the S-R latch. Since sub-threshold currents are needed to toggle the S-R latch, the oscillator begins to oscillate below the threshold voltage.

Low-voltage oscillator with capacitor-ratio selectable duty cycle

A programmable voltage generator has software-programmable registers that may be decoded to generate control bits that turn on select transistors that control a variable resistor network. An external power voltage is input to a regulator transistor, which has a channel resistance controlled by a gate voltage. The channel resistance of the regulator transistor produces a regulated voltage as an output. An op amp compares a reference voltage to a feedback voltage to generate the gate voltage. The feedback voltage is taken from a tap within the variable resistor network. The variable resistor network has select transistors that select one resistor between the regulated voltage and an upper node, and that select one resistor between a lower node and ground. Switches select a tap within a series of resistors between the upper and lower nodes. Y (fine) control bits select the tap while X (coarse) control bits enable select transistors.

Low dropout voltage regulator with programmable on-chip output voltage for mixed signal embedded applications

A zero-delay clock generator has a phase-locked loop (PLL) that generates a feedback clock and receives a reference clocks. All clocks are differential and have a common-mode voltage. The common-mode voltage of an externally-generated reference clock can vary from the common-mode voltage of the internally-generated feedback clock. Differences in common-mode voltage of the reference clock and feedback clock cause delay variations resulting in static phase offsets of generated clocks. A common-mode sense and equalizer senses the common-mode voltages of the buffered reference and feedback clocks, and generates control voltages. The control voltages adjust the common-mode voltage and delay of differential buffers that receive the reference and feedback clocks. The control voltages adjust the differential buffers to match the common-mode voltages of the buffered reference and feedback clocks. The buffered clocks are then applied to a phase and frequency detector of the PLL.

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Davis, CA, United States of America

Kwok Kuen David Kwong