Samsung Electronics Co., Ltd.

Kwan-Jai Lee

Kyong-Soon Cho

Jeong-Kyu Ha

Jae-Min Jung

Sa-Yoon Kang

Na-rae Shin

So-Young Lim

Pa-Lan Lee

Kyoung-Suk Yang

Sang-Uk Han

Seung-Hwan Kim

In-Ku Kang

Kyoung-sei Choi

Jin-Hyuk Lee

Seung-Kon Mok

Jae-Hyok Ko

Myung-Kee Chung

Dae-woo Son

Young-Shin Kwon

Keung-beum Kim

Hyeong-Seob Kim

Chang-Su Kim

Dae-Woo Son

A chip on film package includes a flexible base film having a first surface and a second surface opposite to each other that includes at least one through hole therein, a plurality of wirings disposed on the first surface and the second surface of the base film, respectively, that include a first lead and a second lead connected to each other through the at least one through hole, and a display panel driving chip and a touch panel sensor chip, each mounted on any one of the first surface and the second surface of the base film, wherein at least one of the display panel driving panel and the touch panel sensor chip is electrically connected to the first and second leads.

Chip on film package and display device including the same

A COF substrate may include a base film, first upper conductive patterns, at least one second upper conductive pattern and lower conductive patterns. The first upper conductive patterns may be arranged on an upper surface of the base film. Each of the first upper conductive patterns may have an inner pattern and an outer pattern spaced apart from each other. The second upper conductive pattern may be arranged on the upper surface of the base film between the first upper conductive patterns. The lower conductive patterns may be arranged on a lower surface of the base film. The lower conductive patterns may be electrically connected between the inner pattern and the outer pattern. Thus, conductive materials causing a short between the panel patterns may not exist between the inner pattern and the outer pattern on the upper surface of the base film.

Chip on film (COF) substrate, COF package and display device including the same

Provided are a chip on film (COF) package and semiconductor having the same. The COF package can include a flexible film having first and second surfaces opposite to and facing each other and including a conductive via penetrating from the first surface to the second surface, first and second conductive patterns respectively is on the first surface and the second surface and electrically connected to each other through the conductive via, an integrated circuit (IC) chip is on the first surface and electrically connected to the first conductive pattern, a test pad overlaps the conductive via and is electrically connected to at least one of the first conductive pattern and the second conductive pattern, and an external connection pattern is on the second surface spaced apart from the conductive via and electrically connected to the second conductive pattern.

Chip on film package including test pads and semiconductor devices including the same

A semiconductor package may include a substrate, a semiconductor chip disposed on the substrate, a communication terminal and a static electricity inducing terminal connected to a ground. The package may include a first sealant that comprises a voltage sensitive material and that covers the semiconductor chip and a static electricity blocking layer that provides a conductive pathway from the first sealant to only the static electric inducing terminal. The static electricity blocking layer may prevent the communication terminal from being electrically connected to the first sealant. If a buildup of charge is applied to the device, the first sealant may become polarized and/or conductive. The extra voltage may travel through the first sealant to the static electricity inducing terminal via an opening in the static electricity blocking layer. The semiconductor chip and the communication terminal may not be affected by the extra charge.

Semiconductor package

A structure of a semiconductor chip package is provided. The semiconductor chip package includes: a substrate; a semiconductor chip mounted on a first surface of the substrate; a plurality of electrode pads on a second surface, different from the first surface, of the substrate; and an electrostatic discharge protection pad overlapping a portion of a first electrode pad and a portion of a second electrode pad among the plurality of electrode pads.

Semiconductor chip package

A tape circuit substrate and semiconductor apparatus employing the same, and a method for forming a tape circuit substrate may reduce or eliminate electromagnetic interference (EMI) and provide a substrate or apparatus which can supply a more stable power supply voltage. The tape circuit substrate may include an insulation film and a wiring pattern formed on the insulation film to define an electronic device-mounting region and including a ground electrode. The tape circuit substrate may include a ground electrode pattern formed at the electronic device-mounting region so as to be insulated from the wiring pattern, except where the ground electrode pattern is connected to the ground electrode.

Tape circuit substrate and semiconductor apparatus employing the same

A semiconductor chip package includes an IC chip and a tape circuit substrate. The tape circuit substrate has a base film and a plurality of beam leads formed on the base film. One end portion of each beam lead extends from the base film, and the extended portion has a widthwise wavy portion. The widthwise wavy portion may be, for example, semicircular shaped, S-shaped or zig-zag shaped. The IC chip has chip pads formed on a top surface thereof.

Tape circuit substrate having wavy beam leads and semiconductor chip package using the same

A three-dimensional, multi-chip package with chip selection pads formed at the chip-level and a manufacturing method thereof are provided. The three-dimensional, multi-chip package is formed by stacking a number (N) of semiconductor integrated circuit chips. Each chip comprises an integrated circuit die, a chip selection terminal, (N&minus;1) chip selection pads, an insulation layer, (N&minus;1) metal wirings, upper connection terminals, lower connection terminals, and trench wirings. The chip selection terminal of each chip is separated from the chip selection of the other chips by the chip selection pads formed at the chip-level.

Three-dimensional multi-chip package having chip selection pads and manufacturing method thereof

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Yongin-si, South Korea

Kwan-Jai Lee