Ets-Lindgren, Inc.

Emc Test Systems, L.p.

Kefeng Liu

Bryan Howard Sayler

Michael David Foegelle

Zhong Chen

Vicente Rodr&iacute;quez-Pereyra

Embodiments include an anechoic chamber lined with absorber to absorb electromagnetic energy incident upon the absorber and reflector edge interfaces. The chamber comprises a reflector to reflect waves from a source to form a substantially plane wave field in a test zone within the chamber. In some embodiments, the outer periphery of the reflector extends to the interior walls, floor and ceiling of the chamber. The outer periphery of the reflector is embedded in the absorber in some embodiments.

Termination of edges of a parabolic reflector in a compact range

A matching network hybrid electro-magnetic compatibility (EMC) absorber. A substrate of any number of materials serves as the frame on which partial coatings are placed. Design parameters governing the substrate and other parameters governing the coating control the electrical properties of the matching network hybrid EMC absorber. By performing partial and/or full coating, the physical shape and mechanical properties of the matching network hybrid EMC absorber may be de-coupled from the electrical properties. A designer modifies and controls the electrical performance of an electro-magnetic test system by special-tailoring a matching network hybrid EMC absorber. An electro-magnetic wave to ensure that a majority of the electro-magnetic wave is absorbed into a lossy, absorber material mounted on the walls of a test chamber in the frequency range from 20-500 MHz. Typically, the absorber material includes ferrite tiles, and the present invention ensures that a majority of the electro-magnetic illumination within a test chamber is properly absorbed by these ferrite tiles. The matching network hybrid EMC absorber operates as a broadband matching network at a low frequency range. Using of a computer model and numerical optimization, the lossy films of the matching network can also be designed so that it absorbs majority of the RF energy before it reaches the flat surface of ferrite tile in the frequency range of 500 MHz to 40 GHz. The combined design method presents a new cost effective method to manufacture hybrid EMC absorbers in a extremely broadband frequency range from 20 MHz to 40 GHz.

Matching network hybrid electro-magnetic compatibility absorber

A test system having a shielded enclosure and common air interface for testing the transmit and receive functionality of wireless communication devices such as mobile phones. A test system according to the present invention provides improved fault coverage by permitting robust testing of the entire signal path of a wireless device, including the antenna structure. In one embodiment of the invention, an RF-shielded enclosure having a test chamber is provided. The structure of the shielded enclosure blocks ambient RF energy from entering the test chamber and interfering with testing operations. The shielded enclosure may be lined with an RF absorbing material to improve test repeatability. A novel test antenna structure is disposed in the test chamber for wirelessly communicating test signals to a device under test. The test antenna is designed to maximize coupling with the antenna(s) of one or more types of wireless devices, while also minimizing variations in test measurements that might result from the particularized location of batteries or processing circuitry within such devices. The test antenna is coupled to an RF connector that provides a connection point for an external test set functioning as a base-station simulator for use in testing all or a subset of the features of the device under test. The test antenna may be formed on a printed circuit board. In one such embodiment, the elements of the test antenna are formed on a printed circuit board, with the element nearest the antenna of the device under test formed on the side of the circuit board nearest the device under test. The remainder of the test antenna is formed on the opposite side of the printed circuit board.

Shielded enclosure for testing wireless communication devices

A diagonal dual-polarized broadband horn antenna. The unique use of diagonal line ridges placed in the corners of the aperture of the diagonal dual-polarized broadband horn antenna. The sides of the diagonal dual-polarized broadband horn antenna are made of any number of materials including dielectric material or metallic material. The operating frequency range of one embodiment of the present invention is approximately 100 MHz to 18 GHz in one embodiment. The present invention is scaleable to allow operation at even higher and lower frequencies. This ability of the present invention to adapt to a number of frequency ranges allows application for a wide variety of electromagnetic testing applications. The use of the diagonal line ridges allows for a broadband horn antenna that is significantly more manageable that conventional broadband horn antennas, while offering operation at common frequency ranges. Moreover, the unique use of the diagonal line ridges provides for operation at the lower ends of the frequency spectrum without requiring the radical increase in size that conventional broadband horn antenna approaches require. The present invention allows for use of any number of tuning bars to focus the frequencies emitted from a diagonal dual-polarized broadband horn antenna into a common direction. The use of the present invention is operable to perform electromagnetic testing of any number of devices including wireless communication devices, wireless appliances, satellite communication devices, and other devices.

Growing community of inventors

Round Rock, TX, United States of America

Kefeng Liu