Samsung Corning Co., Ltd.

Ju Yeol Baek

Jong Eun Ha

Taek Cheon Kim

Jang Soo Choi

Jae Seok Choi

An on-line measuring system for measuring a thickness of a transferred substrate includes a first image detector, a second image detector, an elevator, and a display device. After the first image detector indicates a vertical variation of a bottom surface of the substrate, the second image detector captures an image of the bottom surface of the substrate. The elevator perpendicularly moves the second image detector with respect to the bottom surface of the glass substrate, depending on the vertical variation of the bottom surface, such that a vertical distance between the bottom surface and the second image detector remains constant. Then, a controller processes the image of the bottom surface to calculate a distance between opposite edges of the bottom surface, thereby obtaining a thickness of the substrate.

Growing community of inventors

Suwon-si, South Korea

Ju Yeol Baek