Samsung Electronics Co., Ltd.

Jong-joo Lee

Sun-Won Kang

Yong-hoon Kim

Seung-Duk Baek

Un-Byoung Kang

Cha-Jea Jo

Tae-Hong Min

Tae-Joo Hwang

Hee-Seok Lee

Young-Don Choi

Seok-Jae Han

Young-Hee Song

Moon-Jung Kim

Sang-Youb Lee

A package-on-package (PoP)-type package includes a first semiconductor package having a first passive element and a first semiconductor device mounted on a first substrate, and a second semiconductor package having a second semiconductor device mounted on a second substrate. The first passive element is electrically connected to the second semiconductor device. Related devices are also discussed.

Package-on-package type package including integrated circuit devices and associated passive components on different levels

A package board is provided. The package board includes a board body having a front surface and a back surface. A first power pad, a first ground pad, a first signal pad, a first internal terminal pad and a second internal terminal pad are disposed on the front surface of the board body, and a second power pad, a second ground pad and a second signal pad are disposed on the back surface of the board body. The second power pad, the second ground pad and the second signal pad are electrically connected to the first power pad, the first ground pad and the first signal pad, respectively. An internal terminal interconnection is provided in a bulk region of the board body or on a surface of the board body. The internal terminal interconnection electrically connects the first internal terminal pad to the second internal terminal pad. A semiconductor package employing the package board is also provided.

Package board having internal terminal interconnection and semiconductor package employing the same

An integrated circuit (IC) card socket includes a frame having a fixing portion and a connector. The connector includes a first portion fixed by the fixing portion, a second portion connected to one end of the first portion to contact a motherboard, and a third portion connected to another end of the first portion. The third portion has a shape of at least a portion of a loop, and a portion of the third portion contacts an IC card moving toward the third portion.

Integrated circuit card socket having a terminal with a loop-shaped portion

A semiconductor package, comprising: a substrate; a first semiconductor chip; and at least one second semiconductor chip. The first semiconductor chip and the at least one second semiconductor chip are stacked on the substrate; the first semiconductor chip is electrically connected with the substrate; and an electrical connection of each second semiconductor chip is formed through a secondary input/output buffer of the first semiconductor chip.

Semiconductor package

A semiconductor device is disclosed including a through electrode. The semiconductor device may include a first semiconductor chip including a transceiver circuit formed on a first surface, a first coupling conductive pattern which is formed on a second surface opposite the first surface, and a through electrode which connects the transceiver circuit and the first coupling conductive pattern. There may be a transceiver located on a second semiconductor chip and including a second coupling conductive pattern facing the first coupling conductive pattern which communicates wirelessly with the first coupling conductive pattern.

Semiconductor device including coupling conductive pattern

A multi-chip package may include a package substrate, an interposer chip, a first semiconductor chip, a thermal dissipation structure and a second semiconductor chip. The interposer chip may be mounted on the package substrate. The first semiconductor chip may be mounted on the interposer chip. The first semiconductor chip may have a size smaller than that of the interposer chip. The thermal dissipation structure may be arranged on the interposer chip to surround the first semiconductor chip. The thermal dissipation structure may transfer heat in the first semiconductor chip to the interposer chip. The second semiconductor chip may be mounted on the first semiconductor chip. Thus, the heat in the first semiconductor chip may be effectively transferred to the interposer chip through the thermal dissipation line.

Multi-chip package and method of manufacturing the same

A semiconductor package may include a package substrate, a first semiconductor chip and a second semiconductor chip. The first semiconductor chip may be arranged on the package substrate. The first semiconductor chip may have a plug electrically connected to the package substrate and at least one insulating hole arranged around the plug. The second semiconductor chip may be arranged on the first semiconductor chip. The second semiconductor chip may be electrically connected to the plug. Thus, the insulating hole and the insulating member may ensure an electrical isolation between the plug and the first semiconductor chip, and between the plugs.

Semiconductor package and method of manufacturing the same

A package substrate includes an insulating substrate, a functional pattern and a main dummy pattern. A semiconductor chip is arranged on the insulating substrate. The functional pattern is formed on the insulating substrate. The functional pattern is electrically connected to the semiconductor chip. The main dummy pattern is formed on a portion of the insulating substrate at least of to the outside of and/or adjacent the functional pattern in a path of stress generated by a difference between thermal expansion coefficient of the insulating substrate and the semiconductor chip, so as to divert the stress away from the functional pattern. Thus, the stress is not concentrated on the functional pattern. As a result, damage to the functional bump caused by the stress is prevented.

Package substrate having main dummy pattern located in path of stress

A flip chip package may include a substrate, a semiconductor chip, main bump structures and auxiliary bump structures. The substrate has a circuit pattern. The semiconductor chip is arranged over the substrate. The semiconductor chip includes a body having semiconductor structures, main pads electrically connected to the semiconductor structures to mainly control the semiconductor structures, and auxiliary pads electrically connected to the semiconductor structures to provide auxiliary control of the semiconductor structures. The main bump structures are interposed between the semiconductor chip and the substrate to electrically connect the circuit pattern with the main pads. The auxiliary bump structures can be interposed between the semiconductor chip and the substrate to electrically connect the circuit pattern with the auxiliary pads.

Flip chip package

An electronic device includes a substrate having a first surface and a second surface, a semiconductor device disposed on a first region on the first surface of the substrate, a via structure penetrating the substrate, and including a conductor, an optical channel disposed in the via structure, and an optical-electrical converting device disposed at an end of the via structure, electrically connected to the semiconductor device through the conductor of the via structure, and optically connected to the optical channel.

Electronic device having optical communicating part

A semiconductor chip including a chip via plug penetrating a substrate, a semiconductor stack thereof, a semiconductor device package thereof, and an electronic apparatus having the same are disclosed. The semiconductor chip comprising, a substrate including an inner semiconductor circuit, a conductive redistribution structure formed on the substrate including a conductive redistribution interconnection and a conductive redistribution via plug, wherein the redistribution via plug is connected to the inner semiconductor circuit; a conductive chip pad formed on the substrate, and a conductive chip via plug configured to penetrate the substrate and electrically connected to the redistribution structure.

Semiconductor chip including a chip via plug penetrating a substrate, a semiconductor stack, a semiconductor device package and an electronic apparatus including the semiconductor chip

A three-dimensional (3D) semiconductor device including a plurality of stacked layers and a through-silicon via (TSV) electrically connecting the plurality of layers, in which in signal transmission among the plurality of layers, the TSV transmits a signal that swings in a range from an offset voltage that is higher than a ground voltage to a power voltage, thereby minimizing an influence of a metal-oxide-semiconductor (MOS) capacitance of TSV.

Three-dimensional stacked structure semiconductor device having through-silicon via and signaling method for the semiconductor device

A chip stack package includes a plurality of chips that are stacked by using adhesive layers as intermediary media, and a through via electrode formed through the chips to electrically couple the chips. The through via electrode is classified as a power supply through via electrode, a ground through via electrode, or a signal transfer through via electrode. The power supply through via electrode and the ground through via electrode are formed of a first material such as copper, and the signal transfer through via electrode is formed of second material such as polycrystalline silicon doped with impurities. The signal transfer through via electrode may have a diametrically smaller cross section than that of each of the power supply through via electrode and the ground through via electrode regardless of their resistivities.

Growing community of inventors

Suwon-si, South Korea

Jong-joo Lee