Asylum Research Corporation

Jonathan Hensel

Roger B Proksch

Jason Paul Cleveland

Maarten Rutgers

Mario Viani

James A Hodgson

Matthew Klonowski

Anil Gannepalli

Daren Walters

Paul Costales

A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument. All these modules and many of their subassemblies are replaceable and potentially upgradeable. This allows updating to new technology as it becomes available.

Modular atomic force microscope

Growing community of inventors

Santa Barbara, CA, United States of America

Jonathan Hensel