Jonathan Hensel

Title: Innovations of Jonathan Hensel in Atomic Force Microscopy

Introduction

Jonathan Hensel is a notable inventor based in Santa Barbara, California. He has made significant contributions to the field of atomic force microscopy, particularly through his innovative designs and patents. His work focuses on enhancing measurement techniques and improving the functionality of scientific instruments.

Latest Patents

Hensel holds a patent for a Modular Atomic Force Microscope (AFM). This advanced device provides faster measurements by utilizing smaller probes to detect smaller forces and movements. The modular design of the AFM/SPM allows for the replacement and upgrading of various components, ensuring that the instrument can adapt to new technologies as they emerge. This innovation addresses the limitations of older generations of atomic force microscopes, which struggled with noise artifacts and measurement accuracy.

Career Highlights

Jonathan Hensel is associated with Asylum Research Corporation, where he applies his expertise in developing cutting-edge scientific instruments. His work has been instrumental in advancing the capabilities of atomic force microscopy, making it more efficient and reliable for researchers.

Collaborations

Hensel has collaborated with notable colleagues, including Roger B Proksch and Mario Viani. These partnerships have contributed to the development of innovative solutions in the field of microscopy.

Conclusion

Jonathan Hensel's contributions to atomic force microscopy exemplify the impact of innovation in scientific research. His modular AFM design represents a significant advancement in measurement technology, showcasing his commitment to improving scientific instruments.