Growing community of inventors

Fremont, CA, United States of America

Jinxin Fu

Average Co-Inventor Count = 3.59

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 5

Jinxin FuLudovic Godet (32 patents)Jinxin FuYangyang Sun (12 patents)Jinxin FuKazuya Daito (7 patents)Jinxin FuYongan Xu (7 patents)Jinxin FuRutger Meyer Timmerman Thijssen (5 patents)Jinxin FuKang Luo (4 patents)Jinxin FuRobert Jan Visser (3 patents)Jinxin FuYifei Wang (3 patents)Jinxin FuJoseph C Olson (2 patents)Jinxin FuMorgan Evans (2 patents)Jinxin FuWayne McMillan (2 patents)Jinxin FuKarl J Armstrong (2 patents)Jinxin FuTapashree Roy (2 patents)Jinxin FuNaamah Argaman (2 patents)Jinxin FuFariah Hayee (2 patents)Jinxin FuJhenghan Yang (2 patents)Jinxin FuNai-Wen Pi (2 patents)Jinxin FuChan Juan Xing (2 patents)Jinxin FuSamarth Bhargava (1 patent)Jinxin FuMingwei Zhu (1 patent)Jinxin FuYue Chen (1 patent)Jinxin FuBencherki Mebarki (1 patent)Jinxin FuDavid Masayuki Ishikawa (1 patent)Jinxin FuTakashi Kuratomi (1 patent)Jinxin FuZihao Yang (1 patent)Jinxin FuRami Hourani (1 patent)Jinxin FuYongmei Chen (1 patent)Jinxin FuIan Matthew McMackin (1 patent)Jinxin FuJing Jiang (1 patent)Jinxin FuJingyi Yang (1 patent)Jinxin FuMichael David-Scott Kemp (1 patent)Jinxin FuJinyu Lu (1 patent)Jinxin FuWubin Pang (1 patent)Jinxin FuRavi Komanduri (1 patent)Jinxin FuWilson Banez (1 patent)Jinxin FuQun Jing (1 patent)Jinxin FuJinxin Fu (38 patents)Ludovic GodetLudovic Godet (241 patents)Yangyang SunYangyang Sun (12 patents)Kazuya DaitoKazuya Daito (31 patents)Yongan XuYongan Xu (20 patents)Rutger Meyer Timmerman ThijssenRutger Meyer Timmerman Thijssen (81 patents)Kang LuoKang Luo (12 patents)Robert Jan VisserRobert Jan Visser (99 patents)Yifei WangYifei Wang (10 patents)Joseph C OlsonJoseph C Olson (130 patents)Morgan EvansMorgan Evans (83 patents)Wayne McMillanWayne McMillan (24 patents)Karl J ArmstrongKarl J Armstrong (14 patents)Tapashree RoyTapashree Roy (12 patents)Naamah ArgamanNaamah Argaman (9 patents)Fariah HayeeFariah Hayee (3 patents)Jhenghan YangJhenghan Yang (3 patents)Nai-Wen PiNai-Wen Pi (3 patents)Chan Juan XingChan Juan Xing (2 patents)Samarth BhargavaSamarth Bhargava (53 patents)Mingwei ZhuMingwei Zhu (48 patents)Yue ChenYue Chen (45 patents)Bencherki MebarkiBencherki Mebarki (31 patents)David Masayuki IshikawaDavid Masayuki Ishikawa (25 patents)Takashi KuratomiTakashi Kuratomi (20 patents)Zihao YangZihao Yang (17 patents)Rami HouraniRami Hourani (16 patents)Yongmei ChenYongmei Chen (12 patents)Ian Matthew McMackinIan Matthew McMackin (4 patents)Jing JiangJing Jiang (3 patents)Jingyi YangJingyi Yang (2 patents)Michael David-Scott KempMichael David-Scott Kemp (2 patents)Jinyu LuJinyu Lu (2 patents)Wubin PangWubin Pang (1 patent)Ravi KomanduriRavi Komanduri (1 patent)Wilson BanezWilson Banez (1 patent)Qun JingQun Jing (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Applied Materials, Inc. (37 from 13,520 patents)


38 patents:

1. 12416858 - Optical device with elements having outwardly-curved opposing leading edges spaced according to a duty cycle, pitch, and critical dimension

2. 12398998 - Methods for high-resolution, stable measurement of pitch and orientation in optical gratings

3. 12393025 - Waveguide combiners having arrangements for image uniformity

4. 12386155 - Ultra-wide angle lens systems with external pupil

5. 12378662 - Ion implantation to modify glass locally for optical devices

6. 12379280 - Method of measuring efficiency for optical devices

7. 12249489 - Optical device improvement

8. 12236575 - In-line metrology systems, apparatus, and methods for optical devices

9. 12229940 - In-line metrology systems, apparatus, and methods for optical devices

10. 12203747 - Interference in-sensitive Littrow system for optical device structure measurement

11. 12165341 - Optical resolution measurement method for optical devices

12. 12159392 - Die system and method of comparing alignment vectors

13. 12153344 - Lithography method to form structures with slanted angle

14. 12140494 - Method to measure light loss of optical films and optical substrates

15. 12085475 - Method to determine line angle and rotation of multiple patterning

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