Average Co-Inventor Count = 4.58
ph-index = 8
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Samsung Electronics Co., Ltd. (20 from 131,611 patents)
2. Infineon Technologies Ag (1 from 14,724 patents)
3. Chartered Semiconductor Manufacturing Ltd (corporation) (1 from 962 patents)
20 patents:
1. 10651179 - Integrated circuit device and method of manufacturing the same
2. 10134856 - Semiconductor device including contact plug and method of manufacturing the same
3. 10014304 - Integrated circuit device and method of manufacturing the same
4. 9613002 - Method of calibrating target values and processing systems configured to calibrate the target values
5. 9508727 - Integrated circuit device and method of manufacturing the same
6. 8008177 - Method for fabricating semiconductor device using a nickel salicide process
7. 7800134 - CMOS integrated circuit devices having stressed NMOS and PMOS channel regions therein
8. 7781276 - Methods of forming CMOS integrated circuits that utilize insulating layers with high stress characteristics to improve NMOS and PMOS transistor carrier mobilities
9. 7781322 - Nickel alloy salicide transistor structure and method for manufacturing same
10. 7534678 - Methods of forming CMOS integrated circuit devices having stressed NMOS and PMOS channel regions therein and circuits formed thereby
11. 7465617 - Method of fabricating a semiconductor device having a silicon oxide layer, a method of fabricating a semiconductor device having dual spacers, a method of forming a silicon oxide layer on a substrate, and a method of forming dual spacers on a conductive material layer
12. 7365025 - Methods of forming dual-damascene interconnect structures on semiconductor substrates using multiple planarization layers having different porosity characteristics
13. 7297584 - Methods of fabricating semiconductor devices having a dual stress liner
14. 7098123 - Methods of forming a semiconductor device having a metal gate electrode and associated devices
15. 7084061 - Methods of fabricating a semiconductor device having MOS transistor with strained channel