Novellus Systems Incorporated

J Patrick Rymer

Erich R Klawuhn

Kaihan Abidi Ashtiani

Karl B Levy

Maximilian Albert Biberger

Kwok Fai Lai

A method of depositing thin films comprising tantalum, tantalum nitride, and copper for barrier films and seed layers within high aspect ratio openings used for copper interconnects. The barrier films and seed layers are deposited at extremely low temperature conditions wherein the wafer stage temperature of the sputter source is chilled to about &#x2212;70&#xb0; C. to about 0&#xb0; C. Most preferably, the present invention is practiced using a hollow cathode magnetron. The resulting tantalum and/or tantalum nitride barrier films and copper seed layers are superior in surface smoothness, grain size and uniformity such that subsequent filling of the high aspect ratio opening is substantially void-free.

Apparatus and method for depositing superior Ta (N) copper thin films for barrier and seed applications in semiconductor processing

A method of depositing thin films comprising tantalum, tantalum nitride, and copper for barrier films and seed layers within high aspect ratio openings used for copper interconnects. The barrier films and seed layers are deposited at extremely low temperature conditions wherein the wafer stage temperature of the sputter source is chilled to about &minus;70&deg; C. to about 0&deg; C. Most preferably, the present invention is practiced using a hollow cathode magnetron. The resulting tantalum and/or tantalum nitride barrier films and copper seed layers are superior in surface smoothness, grain size and uniformity such that subsequent filling of the high aspect ratio opening is substantially void-free.

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Livermore, CA, United States of America

J Patrick Rymer