Samsung Electronics Co., Ltd.

Hyun Jun Yoon

Kitae Park

Donghun Kwak

Ki Tae Park

Moo Sung Kim

Dongkyo Shim

Bo Geun Kim

Sang Yong Yoon

Il Han Park

Doohyun Kim

Dae Seok Byeon

Han Jun Lee

Jin Bae Bang

Seung Hwan Song

Na Young Choi

Ki-Tae Park

Hyun-Wook Wook Park

Ji-sang Lee

Dong-Hun Kwak

Jaeyong Jeong

Myung-Hoon Choi

Changyeon Yu

Jonghoo Jo

A nonvolatile memory device includes a memory cell region including first metal pads and a memory cell array, and a peripheral circuit region including second metal pads, row decoder circuitry that is connected to the rows of the memory cells through word lines and controls voltages of the word lines, and page buffer circuitry that is connected to the columns of the memory cells through bit lines. The page buffer circuitry is configured to obtain first values by performing a first sensing operation on first bit lines of the bit lines through the first transistors and obtain second values by performing a second sensing operation on the second bit lines of the bit lines through the second transistors, wherein the first values or the second values are inverted. The peripheral circuit region is vertically connected to the memory cell region by the metal pads directly.

Nonvolatile memory device, operating method of nonvolatile memory device, and storage device including nonvolatile memory device

A nonvolatile memory device includes a memory cell array that includes memory cells arranged in rows and columns, row decoder circuitry that is connected to the rows of the memory cells through word lines and controls voltages of the word lines, and page buffer circuitry that is connected to the columns of the memory cells through bit lines and includes first transistors configured to sense voltages of the bit lines and second transistors configured to invert and sense the voltages of the bit lines. The page buffer circuitry is configured to obtain first values by performing a first sensing operation on first bit lines of the bit lines through the first transistors and obtain second values by performing a second sensing operation on the second bit lines of the bit lines through the second transistors, wherein the first values or the second values are inverted.

A nonvolatile memory device may include a page buffer including a plurality of latch sets that latch each page datum of selected memory cells among a plurality of memory cells according to each of read signal sets including at least one read signal, and a control logic configured to detect a degradation level of the memory cells and determine a read parameter applied to at least one of the read signal sets based on the detected degradation level.

Nonvolatile memory device configured to adjust a read parameter based on degradation level

Nonvolatile memory device configured to adjust a read parameter based on a degradation level

A nonvolatile memory device includes a memory cell array including a plurality of memory cells, an address decoder configured to be connected to the memory cells through a plurality of word lines and to provide select or unselect read voltages to the word lines, and a control logic configured to control the address decoder to perform a plurality of read sequences in a continuous read mode and to adjust a word line setup start point in at least one of the read sequences to be different than a word line setup start point in at least one of the other read sequences, wherein the word line setup start point is a time at which the select or unselect read voltages begin to be provided to the word lines.

Nonvolatile memory device and a method of reading the same

A nonvolatile memory device includes a cell array including a plurality of cell strings extending on a substrate in a vertical direction, a page buffer connected to a plurality of bit lines and configured to store sensing data of the cell array in a sensing operation, a voltage generator configured to provide voltages to a plurality of word lines and the plurality of bit lines, and an input/output buffer configured to temporarily store the sensing data received in a data dump from the page buffer and to output the temporarily stored data to an external device. The nonvolatile memory device further includes control logic configured to set a status of the nonvolatile memory device to a ready state after the sensing data is dumped to the input/output buffer and before recovery of the cell array from a bias voltage of the sensing operation is complete.

Nonvolatile memory devices, memory systems and related control methods

A method of programming a flash memory device comprises programming selected memory cells, performing a verification operation to determine whether the selected memory cells have reached a target program state, and determining a start point of the verification operation based on a programming characteristic associated with a detection of a pass bit during programming of an initial program state.

Flash memory device using adaptive program verification scheme and related method of operation

Nonvolatile memory devices, memory systems, and control methods using simultaneous recovery and output operations

A method of programming a nonvolatile memory device comprises applying at least one test program pulse to selected memory cells located in a scan read area, performing a scan read operation on the selected memory cells following application of the at least one test program pulse to detect at least one one-shot upper cell, calculating an offset voltage corresponding to a scan read region at which the scan read operation is performed, setting a program start bias using the offset voltage, and executing at least one program loop using the program start bias.

Programming nonvolatile memory device using program voltage with variable offset between programming state distributions

A nonvolatile memory device may include a memory cell array which is arranged in rows and columns and has multi-level memory cells; a voltage generator providing a plurality of read voltages to a selected row of the memory cell array; and control logic performing a plurality of page read operations using the read voltages. A first read voltage and a second read voltage among the plurality of read voltages are each associated with a higher probability of occurrence of a bit read error than at least one other read voltage among the plurality of read voltages. The control logic uses the first read voltage and the second read voltage in different page read operations than each other.

Nonvolatile memory device and memory system including the same

A method of programming a nonvolatile memory device comprises performing an N-th program loop based on state data stored in data latches according to a default state ordering, determining whether conversion of the default state ordering is required according to a predetermined criterion, as a consequence of determining that conversion of the default state ordering is required, converting all or part of the state data stored in the data latches from the default state ordering to another state ordering, and performing a (N+1)th program loop based on the converted state data.

Nonvolatile memory device, memory system comprising same, and method of programming same

An operating method for a non-volatile memory device includes applying first and second read voltages to a first word line to perform a read operation; counting first memory cells each having a threshold voltage belonging to a first voltage range between the first read voltage and the second read voltage; applying a third read voltage to the first word line sequentially after applying the second read voltage to count second memory cells each having a second threshold voltage belonging to a voltage range between the second read voltage and the third read voltage; comparing the number of first memory cells counted and the number of second memory cells counted; determining a fourth read voltage based on a result of the comparing; and applying the fourth read voltage to the first word line sequentially after applying the third read voltage.

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Seongnam-si, South Korea

Hyun Jun Yoon