Taiwan Semiconductor Manufacturing Comp. Ltd.

Hsu-Shun Chen

Cheng-Hsiung Kuo

Gu-Huan Li

Cheng Hung Lee

Yue-Der Chih

Chung-Yi Wu

Hong-Chen Cheng

Chung-Ji Lu

Chung-Cheng Chou

Zheng-Jun Lin

Pei-Ling Tseng

Chien-An Lai

Chih-Chieh Chiu

Chung-Chieh Chen

Hung-Jen Liao

Jerry Chen

Yu-Der Chih

Shao-Yu Chou

Wei Min Chan

Cheng-Hung Lee

Uppu Sharath Chandra

Lee-Cheng Hung

A memory circuit includes a bias voltage generator including a first node, a current source coupled between a first power supply node and the first node, and a first transistor and a first resistive device coupled in series between the first node and a power reference node. A drive circuit includes a second node, an amplifier including a first input terminal coupled to the first node and a second input terminal coupled to the second node, and a second transistor coupled between a second power supply node and the second node and including a gate coupled to an output terminal of the amplifier, and a resistive random-access memory (RRAM) device is coupled between the second node and the power reference node.

RRAM circuit and method

A memory circuit includes a bias voltage generator including a bias voltage node, an activation voltage generator including a resistive device, and a first amplifier, a drive circuit including a second amplifier including an input terminal coupled to the bias voltage node, and a resistive random-access memory (RRAM) array. The activation voltage generator and the first amplifier are configured to generate a portion of a bias voltage level on the bias voltage node based on a resistance of the resistive device, and the drive circuit is configured to output a drive voltage having the bias voltage level to the RRAM array.

A memory circuit includes a bias voltage generator, a drive circuit, and a resistive random-access memory (RRAM) device. The bias voltage generator includes a first transistor configured to generate a voltage difference based on a first current and an activation voltage, and is configured to output the activation voltage and a bias voltage based on the voltage difference. The drive circuit is configured to receive the bias voltage and output a drive voltage having a voltage level based on the bias voltage, and the RRAM device is configured to receive the activation voltage and conduct a second current responsive to the drive voltage and the activation voltage.

A memory circuit includes a bias voltage generator, a drive circuit, and a resistive random-access memory (RRAM) device. The bias voltage generator includes a first current path configured to receive a first current from a current source, and output a bias voltage based on a voltage difference generated from conduction of the first current in the first current path. The drive circuit is configured to receive the bias voltage and output a drive voltage having a voltage level based on the bias voltage, and the RRAM device is configured to conduct a second current responsive to the drive voltage.

A nonvolatile memory device comprises a cell array including a memory cell. The nonvolatile memory device also includes a reference signal generator configured to generate a reference current for reading data stored in the memory cell. The reference signal generator includes a first circuit coupled to a current summation node and having a reference cell. The first circuit is configured to generate a first current that flows between drain and source terminals of a transistor in the reference cell. The reference signal generator also includes a second circuit coupled to the current summation node and configured to generate a second current that is a temperature-dependent current. The current summation node is configured to combine the first and second currents to generate the reference current that tracks a temperature trend of a current flowing through the memory cell.

Method of setting a reference current in a nonvolatile memory device

A multiple-time programmable (MTP) structure is provided that can operate using a power supply with a supply voltage of 1.5 V to 5.5 V. When the supply voltage is above a first voltage, a first circuit is configured to induce a second constant voltage at a drain of a second transistor, and to induce the second constant voltage on a terminal in a third circuit. In some embodiments, the third circuit provides a third constant voltage on a gate of a third transistor. When the supply voltage is below the first voltage, a fifth circuit is configured to induce a fourth constant voltage on a terminal in the third circuit. The fourth constant voltage is substantially equal to the second constant voltage.

Multiple-time programmable memory

Nonvolatile memory device and method of setting a reference current in a nonvolatile memory device

An integrated circuit that includes a generator unit connected to one or more pull-up units, one or more pull-up units connected to one or more source lines and an array of memory cells connected to the one or more source lines. The generator unit is configured to set a first voltage signal of each pull-up unit of the one or more pull-up units. Each pull-up unit of the one or more pull-up units is connected with the corresponding source line of the one or more source lines and is configured to set a current of the corresponding source line of the one or more source lines. The array of memory cells is electrically connected to the one or more source lines and one or more bit lines.

Source line voltage regulation scheme for leakage reduction

An electronic device includes a first circuit, a second circuit, and a power on control (POC) circuit. The POC circuit includes an enable terminal electrically connected to a first output of the first circuit, a first input terminal electrically connected to a first voltage supply, a second input terminal electrically connected to a second voltage supply, and an output terminal. The second circuit includes a biasing-sensitive circuit, and a logic circuit including a first input terminal electrically connected to a second output of the first circuit, a second input terminal electrically connected to the output of the POC circuit, and an output terminal electrically connected to an enable terminal of the biasing-sensitive circuit.

Multiple power domain electronic device and related method

An integrated circuit includes a positive power supply node, a current tracking circuit, and a current mirroring circuit including a plurality of current paths coupled in parallel. The currents of the plurality of current paths mirror a current of the current tracking circuit. The current mirroring circuit is configured to turn off the plurality of current paths one-by-one in response to a reduction in a positive power supply voltage on the positive power supply node. The integrated circuit further includes a charging node receiving a summation current of the plurality of current paths, wherein a voltage on the charging node is configured to increase through a charging of the summation current.

Method for extending word-line pulses

The present application discloses a memory circuit having a first decoder coupled to a first memory bank and configured to receive a plurality of address control signals and to generate a first plurality of cell selection signals responsive to the plurality of address control signals and a second decoder coupled to a second memory bank and configured to receive a plurality of inverted address control signals and to generate a second plurality of cell selection signals responsive to the plurality of inverted address control signals. The memory circuit also has an address control signal buffer coupled to the second decoder and configured to convert the plurality of address control signals into the plurality of inverted address control signals.

Memory circuit having decoding circuits and method of operating the same

A power switch includes a control circuit, a cross-coupled amplifier, a first switching circuit coupled between a first output terminal and the first controlled ground terminal, and a second switching circuit coupled between a second output terminal and the second controlled ground terminal. The control circuit is configured to connect the second controlled ground terminal to a ground during a first period that a voltage level at the first output terminal is switched from the ground to a first voltage level and to set the second controlled ground terminal at an elevated ground level during a second period that the voltage level at the first output terminal remains at the first voltage level.

Power switch and operation method thereof

In some embodiments related to a memory array, a sense amplifier (SA) uses a first power supply, e.g., voltage VDDA, while other circuitry, e.g., signal output logic, uses a second power supply, e.g., voltage VDDB. Various embodiments place the SA and a pair of transferring devices at a local IO row, and a voltage keeper at the main IO section of the same memory array. The SA, the transferring devices, and the voltage keeper, when appropriate, operate together so that the data logic of the circuitry provided by voltage VDDB is the same as the data logic of the circuitry provided by voltage VDDA.

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Toufen Town, Taiwan

Hsu-Shun Chen