Industry-University Cooperation Foundation Hanyang University

Hongro Yun

Myung Mo Sung

Hongbum Kim

Jin Seon Park

Provided are a tin oxide layer, a thin film transistor (TFT) having the same as a channel layer, and a method for manufacturing the TFT. The TFT comprises a gate electrode, a tin oxide channel layer disposed on the gate electrode and being a polycrystalline thin film with preferred orientation in a [001] direction, a gate insulating film disposed between the gate electrode and the channel layer, and source and drain electrodes electrically connected to both ends of the channel layer, respectively.

Tin oxide layer, TFT having the same as channel layer, and manufacturing method for the TFT

Provided are P-type semiconductor layer, P-type multilevel element, and manufacturing method for the element. The P-type multilevel element comprises a gate electrode, an active structure overlapping the gate electrode, a gate insulating layer disposed between the gate electrode and the active structure, and source and drain electrodes electrically connected to both ends of the active structure, respectively. The active structure has a first P-type active layer, a second P-type active layer, and a barrier layer disposed between the first P-type active layer and the second P-type active layer. A threshold voltage for forming a channel in the first P-type active layer and a threshold voltage for forming a channel in the second P-type active layer have different values.

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Wonju-si, South Korea

Hongro Yun