Marvell Asia Pte., Ltd.

Harish Mundrathi

Harry I Linzer

Sreekanth G Pai

Santosh Kumar Surendra

A method of testing an integrated circuit device that includes components of first and second types, where the components of the second type consume power when clocked even when not active, includes gating off the clock signal to prevent clock signals from reaching the components of the second type, and applying test inputs to the components of the first type. Gating off the clock signals to the components of the second type may include preventing the clock signals from reaching individual components of the second type, or preventing the clock signals from reaching each clock tree branch that contains only components of the second type, or, when a clock tree serving the components of the second type supplies clock signals only to the components of the second type, preventing the clock signals from reaching the clock tree.

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Bengaluru, India

Harish Mundrathi