Micron Technology Incorporated

Other

Stmicroelectronics S.r.l.

Graziano Mirichigni

Luca Porzio

Danilo Caraccio

Corrado Villa

Daniele Balluchi

Marco Sforzin

Andrea Martinelli

Paolo Amato

Alessandro Orlando

Stefano Zanardi

Erminio Di Martino

Domenico Monteleone

Giacomo Bernardi

Daniele Vimercati

Chee Weng Tan

Andre Klindworth

Federico Pio

Sebastien Lemarie

Christophe Vincent Antoine Laurent

Efrem Bolandrina

Pierguido Garofalo

Greg A Blodgett

Emanuele Confalonieri

Riccardo Muzzetto

Stefan Frederik Schippers

Christophe Laurent

Ferdinando Bedeschi

Marco Dallabora

Giuseppe D'Eliseo

Antonino Pollio

Gianfranco Ferrante

Gianfranco Santopietro

Chris Bueb

Sebastien LeMarie

Methods, systems, and devices related to auto-referenced memory cell read techniques are described. The auto-referenced read may encode user data to include a predetermined number of bits having a first logic state prior to storing the user data in memory cells. The auto-referenced read may store a total number of bits of the user data having a first logic state in a separate set of memory cells. Subsequently, reading the user data may be carried out by applying a read voltage to the memory cells storing the user data while monitoring a series of switching events by activating a subset of the memory cells having the first logic state. During the read operation, the auto-referenced read may compare the number of activated memory cells to either the predetermined number or the total number to determine whether all the bits having the first logic state has been detected. When the number of activated memory cells matches either the predetermined number or the total number, the auto-referenced read may determine that the memory cells that have been activated correspond to the first logic state.

Auto-referenced memory cell read techniques

Methods, systems, and devices for architecture-based power management for a memory device are described. Aspects include operating a first memory bank within a memory device in a first mode and a second memory bank within the memory device in a second mode. The memory device may receive a power down command for the first memory bank while operating the first memory bank in the first mode and the second memory bank in the second mode and switch the first memory bank from the first mode to a first low power mode while maintaining the second memory bank in the second mode. The first low power mode corresponds to less power consumption by the first memory bank than the first mode. In some cases, switching the first memory bank from the first mode to the first low power mode includes deactivating circuitry dedicated to the first memory bank.

Architecture-based power management for a memory device

Methods, systems, and devices for techniques for indicating row activation are described. A memory device may receive an indication associated with an activation command, which may enable the memory device to begin some aspects of an activation operation before receiving the associated activation command. The indication may include a location of a next row to access as part of the activation command. The indication may be included in a previous activation command or in a precharge command. The memory device may begin activation operations for the next row before the precharge operation of the current row is complete. The memory device may receive the activation command for the next row after receiving the indication, and may complete the activation operations upon receiving the activation command.

Techniques for indicating row activation

The present disclosure includes apparatuses and methods for providing power availability information to memory. A number of embodiments include a memory and a controller. The controller is configured to provide power and power availability information to the memory, and the memory is configured to determine whether to adjust its operation based, at least in part, on the power availability information.

Providing power availability information to memory

The present disclosure includes apparatuses and methods for providing energy information to memory. An embodiment includes determining, by a host, that a charge level of an energy source coupled to the host has reached or exceeded a threshold value, and transmitting, from the host to a memory device coupled to the host, signaling indicative of an energy mode for the memory device, wherein the signaling is transmitted based at least in part on determining that the charge level of the energy source has reached or exceeded the threshold.

Providing energy information to memory

The present disclosure relates to a method for operating an array of memory cells, the method comprising storing user data in a plurality of memory cells of the array, storing parity data associated with the user data in a plurality of parity cells of the array, and, based on the stored parity data, selecting an Error Correction Code (ECC) correction capability and/or an ECC granularity according to which an ECC operation is to be performed, wherein the selection of the ECC correction capability and/or the ECC granularity is determined by the steps of updating a first register, said first register comprising values which indicate a required ECC correction capability and/or a required ECC granularity to be applied to the memory cells based on a current status of said memory cells, wherein the values of the first register are updated based on a variation of the current status of the memory cells, and wherein an update of the values of the first register corresponds to a variation of the required ECC correction capability and/or a required ECC granularity to be applied to said memory cells, and based on the updated values of the first register, executing an ECC switch command, wherein the ECC switch command is such as to vary a previously selected ECC correction capability and/or a previously selected ECC granularity, the method further comprising: updating a second register according to the varied ECC correction capability and/or ECC granularity, said second register comprising values indicating the selected ECC correction capability and the selected ECC granularity applied to the memory cells based on the current status thereof. Related apparatuses and systems are also herein disclosed.

ECC configuration in memories

A method to perform data scrub operations by operating a memory device, the memory device comprising a main memory, an internal Error Correction Code (ECC) engine and a scrub memory. The method comprising: receiving a read command; accessing, based on the receiving the read command, a location in the main memory to read data at the location; error correcting data read during the accessing; and storing at the scrub memory information of the location based at least in part on the correcting the data meeting or exceeding an ECC threshold.

Memory device with data scrubbing capability and methods

Methods, systems, and devices for bank-configurable power modes are described. Aspects include operating a memory device that has multiple memory banks in a first mode. While operating in the first mode, the memory device may receive a command to enter a second mode having a lower power consumption level than the first mode. The memory device may enter the second mode by switching a first subset of the memory banks to a first low power mode that operates at a first power consumption level and a second subset of the memory banks to a second low power mode that operates at a second power consumption level that may be lower than the first power consumption level. In some cases, the memory device may switch the first subset of memory banks from the first low power mode while maintaining the second subset of memory banks in the low power mode.

Bank configurable power modes

Methods and systems include memory devices with a memory array comprising a plurality of memory cells. The memory devices include a control circuit operatively coupled to the memory array and configured to receive a read request for data and to apply a first voltage to the memory array based on the read request. The control circuit is additionally configured to count a total number of the plurality of memory cells that have switched to an active read state based on the first voltage and to apply a second voltage to the memory array based on the total number. The control circuit is further configured to return the data based at least on bits stored in a first and a second set of the plurality of memory cells.

Systems and methods for adaptive self-referenced reads of memory devices

Methods and systems include memory devices with a memory array comprising a plurality of memory cells. The memory devices include a control circuit operatively coupled to the memory array and configured to receive a read request for data and to apply a first voltage at a first time duration to the memory array based on the read request. The control circuit is additionally configured to count a number of the plurality of memory cells that have switched to an active read state based on the first voltage and to derive a second time duration. The control circuit is further configured to apply a second voltage at the second duration to the memory array. The control circuit is also configured to return the data based at least on bits stored in a first and a second set of the plurality of memory cells.

A device includes a memory. The device also includes a controller. The controller includes a register configured to store an indication of whether an ability of a received command to alter an access protection scheme of the memory is enabled. The received command may alter the access an access protection scheme of the memory responsive to the indication.

Apparatuses and methods for securing an access protection scheme

Growing community of inventors

Vimercate, Italy

Graziano Mirichigni