Micron Technology Incorporated

Gary O Henderson

Aaron T Bartlett

End effectors, apparatuses including end effectors for conditioning planarizing pads, and methods for manufacturing end effectors with contact elements to condition planarizing pads used in polishing micro-device workpieces are disclosed herein. In one embodiment, an end effector includes a member having a first surface and a plurality of generally uniformly shaped contact elements attached to the first surface. The uniformly shaped contact elements project generally transversely from the first surface. In a further aspect of this embodiment, the uniformly shaped contact elements can be conical, frusto-conical, cylindrical, or other suitable configurations. The contact elements can also have a wear-resistant, carbon-like-diamond, silicon, and/or silicon carbide layer. Furthermore, the contact elements can have generally rounded tips.

End effectors and methods for manufacturing end effectors with contact elements to condition polishing pads used in polishing micro-device workpieces

A method and apparatus for thermally attaching web-based polishing pads in a chemical-mechanical planarization (CMP) system. Specifically, one end of a first web-based polishing pad and an end of a second web-based polishing pad are inserted in a thermal sealing unit. The ends of the polishing pads are brought into contact with each other and secured in place within the thermal sealing unit. A heating element within thermal sealing unit is activated, thereby fusing the polishing pads.

Method for attaching web based polishing materials together on a polishing tool

Method for attaching web-based polishing materials together on a polishing tool

A contour indicator that visually indicates non-uniformities in the planarity of the planarizing surface of a polishing pad. In one embodiment of the invention, a polishing pad has a polishing body with a planarizing surface facing the wafer and a contour indicator embedded in the polishing body. The contour indicator is preferably the material of the polishing body dyed to a color or shade that is visually distinguishable from the polishing body. The contour indicator preferably has first and second sidewalls spaced apart from one another at the planarizing surface of the polishing body, and the contour indicator also has a cross-sectional shape so that the distance between the first and second sidewalls changes with increasing the depth within the pad. In operation, the distance between the first and second sidewalls of the contour indicator changes as material is removed from the planarizing surface, and the distance between the first and second sidewalls at the planarizing surface indicates the contour of the planarizing surface.

Polishing pad contour indicator for mechanical or chemical-mechanical

The present invention is a carrier ring for a semiconductor wafer carrier in which an exposed surface of the carrier ring facing a polishing pad either slopes, is stepped, or is curved away from the polishing pad from the inner periphery to the outer periphery of the carrier ring. As a result, the exposed surface of the carrier ring is spaced farther from the polishing pad adjacent its outer periphery than it is adjacent its inner periphery, thereby increasing the volume and uniformity of slurry transported beneath the wafer.

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Meridian, ID, United States of America

Gary O Henderson