Sun Microsystems, Inc.

Farn Wang

Stephan Hoerold

Manjunath D Haritsa

Kathirqamar Aingaran

A tool for computing noise coupled onto victim lines from aggressor lines of an integrated circuit has code for traversing a victim line of the integrated circuit layout to measure its length, its average width, a coupling length, and a harmonic mean of spacing between the victim line and aggressor lines. The tool has code for computing a resistance, estimated coupling capacitance, and total capacitance of the victim line from these parameters.

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Mountain View, CA, United States of America

Farn Wang