Samsung Electronics Co., Ltd.

Eun-Hye Park

Hoi-ju Chung

Hyo-Jin Kwon

Yong-jun Lee

Yong-Jin Kwon

Soon-Bum Kim

Jun-Ho Shin

Chae-Hoon Kim

Tae-Eun Kim

A method for driving a nonvolatile memory device using a resistive element is provided. The method includes storing data in a page buffer, the data including a first data block and a second data block, writing the first data block to a memory cell, performing a verify-read operation on the first data block of the memory cell region, writing the second data block to the memory cell region, and performing a verify-read operation on the second data block of the memory cell region, wherein the first data block and the second data block are smaller than the page buffer in size.

Method for driving nonvolatile memory device

Provided is a semiconductor device having a high-reliability solder joint. The semiconductor device includes a high-temperature solder formed on a conductive pad. A low-temperature solder having a lower melting point than the high-temperature solder is formed on the high-temperature solder. A barrier layer is formed between the high-temperature solder and the low-temperature solder. An Sn content of the high-temperature solder is higher than that of the low-temperature solder.

Semiconductor device having solder joint and method of forming the same

A nonvolatile memory device includes a buffer memory, a read circuit configured to read first data stored in the buffer memory in a first read operation, and a write circuit configured to write second data in the buffer memory in a first write operation, wherein the first write operation is performed when a first internal write command is generated during the first read operation.

Nonvolatile memory device using a resistance material and a driving method thereof

A nonvolatile memory device includes a memory array having multiple nonvolatile memory cells, a first read circuit and a second read circuit. The first read circuit is configured to read first data from the memory array during a first read operation and to provide one or more protection signals indicating a victim period during the first read operation. The second read circuit is configured to read second data from the memory array during a second read operation and to provide one or more check signals indicating an aggressor period during the second read operation.

Nonvolatile memory device having read circuits for performing Read-While-Write (RWW) operation and Read-Modify-Write (RMW) operation

A nonvolatile memory device comprises a memory core comprising a plurality of variable resistance memory cells, an input/output (I/O) circuit configured to receive a first packet signal and a second packet signal in sequence, the first and second packet signals collectively comprising information for a memory access operation, and further configured to initiate a core access operation upon decoding the first packet signal and to selectively continue or discontinue the core access operation upon decoding the second packet signal, and a read circuit configured to perform part of the core access operation in response to the first packet signal before the second packet signal is decoded.

Growing community of inventors

Iksan-si, South Korea

Eun-Hye Park