International Business Machines Corporation

Eric Miller

Ruilong Xie

Kangguo Cheng

Indira P Seshadri

Stuart A Sieg

Daniel James Dechene

Lawrence Alfred Clevenger

Chen Zhang

Daniel C Edelstein

Chanro Park

Rajiv V Joshi

Dechao Guo

Hemanth Jagannathan

Julien Frougier

Ruqiang Bao

Fee Li Lie

Heng Wu

Kevin Shawn Petrarca

Yann Mignot

Ravikumar Ramachandran

Marc Adam Bergendahl

Nicholas Anthony Lanzillo

John Ryan Sporre

Albert Manhee Chu

Nelson M Felix

Gauri V Karve

Christopher Joseph Waskiewicz

Jay William Strane

Tao Li

Maruf Amin Bhuiyan

Semiconductor devices and methods of forming the same include a first transistor in a first region having a first work function metal layer. A second transistor in a second region has a second work function metal layer that overlaps a portion of the first work function metal layer and that has a vertical part above the portion of the first work function metal layer.

Non-overlapping gate conductors for GAA transistors

A semiconductor structure is provided in which a via to buried power rail (VBPR) contact structure is present that has a via portion contacting a buried power rail and a non-via portion contacting a source/drain region of a first functional gate structure present in a first device region. A dielectric spacer structure including a base dielectric spacer and a replacement dielectric spacer is located between the VPBR contact structure and the first functional gate structure. The replacement dielectric spacer is composed of a gate cut trench dielectric material that is also present in a gate cut trench that is located between the first functional gate structure present in the first device region, and a second functional gate structure that is present in a second device region. The replacement dielectric spacer replaces a damaged region of a dielectric spacer that is originally present during VBPR formation.

Structure containing a via-to-buried power rail contact structure or a via-to-backside power rail contact structure

Embodiments of the invention include a first source region and a first drain region forming a first L-shaped layout. The first source and drain regions are formed on a bottom gate spacer material. Embodiments include a second source region and a second drain region forming a second L-shaped layout, the first L-shaped layout and the second L-shaped layout being interrupted by a gate. One of the first source and drain regions extends in a direction beyond the bottom gate spacer material to form the first L-shaped layout, wherein the direction is parallel to a lengthwise direction of the gate.

Stacked transistor layout for improved cell height scaling

A semiconductor structure includes a front-end-of-line level including a plurality of field effect transistors electrically connected to a back-end-of-line interconnect level. The back-end-of-line interconnect level is located on a first side of the front-end-of-line level. A backside power rail is embedded within a backside interlayer dielectric located on a second side of the front-end-of-line level opposing the first side of the front-end-of-line level. The backside power rail is electrically connected to at least one field effect transistor of the plurality of field effect transistors. At least one backside field effect transistor is formed on a first semiconductor layer disposed, at least in part, above a passive device region. A first side of the passive device region is in contact with the first semiconductor layer and a second side of the passive device region, opposing the first side, is in contact with the back-end-of-line interconnect level.

Semiconductor backside transistor integration with backside power delivery network

Methods, and devices related to authentication of chips using physical unclonable function (PUF) are disclosed. The semiconductor chip has a substrate having a major surface. The semiconductor chip has a boundary defined on the major surface in accordance with a ground rule associated with a gate cut passing (CT) fin formed on the major surface. The semiconductor chip has multiple non-planar devices fabricated on the surface at the boundary. The CT fin forms a random distribution of field effect transistors (FETs) with varying work function metal (WFM) thickness that includes some FETs that fail the ground rule and other FETs that meet the ground rule. A physical unclonable function (PUF) region is defined in accordance with the random distribution.

Physical unclonable function

A gate-all-around device includes a plurality of channel layers vertically stacked over a substrate, an inner spacer located between each of the plurality of channel layers, source/drain regions in contact with opposite ends of a first portion of the plurality of channel layers, and a first dielectric layer on opposite ends of a second portion of the plurality of channel layers located in a spacer region that is adjacent to the source/drain regions. A width of the first dielectric layer and the second portion of the plurality of channel layers is equal to a width of the inner spacer located between each of the plurality of channel layers.

Channel protection of gate-all-around devices for performance optimization

Embodiments disclosed herein include a semiconductor structure for reducing contact to contact shorting. The semiconductor structure may include a gate cut region with a liner and a dielectric core confined within a first lateral side of the liner and a second lateral side of the liner. The semiconductor structure may also include a first source/drain (S/D) contact overlapping the first lateral side and the dielectric core. The first S/D may include a line-end that contacts the second lateral side of the liner.

Source/drain contact positioning under power rail

A method of forming a semiconductor structure includes forming a nanosheet stack including alternating layers of a sacrificial material and a channel material over a substrate, the layers of channel material providing nanosheet channels for one or more nanosheet field-effect transistors. The method also includes forming a hard mask stack over the nanosheet stack, and forming a patterning layer over the hard mask stack. The method further includes patterning a lithographic mask over the patterning layer, the lithographic mask defining (i) one or more first regions for direct printing of one or more fins of a first width in the nanosheet stack and the substrate and (ii) one or more second regions for setting the spacing between two or more fins of a second width in the nanosheet stack and the substrate using self-aligned double patterning. The second width is less than the first width.

Using a same mask for direct print and self-aligned double patterning of nanosheets

A technique relates to a semiconductor device. A first epitaxial material is formed under a bottom surface of a set of fins, the first epitaxial material being under fin channel regions of the set of fins. A second epitaxial material is formed adjacent to the first epitaxial material and remote from the fin channel regions, a combination of the first epitaxial material and the second epitaxial material forming a bottom source or drain (source/drain) layer. A top source/drain layer is formed on an upper portion of the set of fins, gate material being disposed around the set of fins between the top source/drain layer and the bottom source/drain layer.

Bottom source/drain etch with fin-cut-last-VTFET

A method for forming a stacked transistor includes forming a sacrificial cap over a first interconnect of a lower level transistor. The method further includes forming an upper level transistor above the sacrificial cap. The method further includes removing the sacrificial cap to form an opening such that the opening is delimited by the upper level transistor. The method further includes forming a second interconnect in the opening such that the second interconnect is in direct contact with the first interconnect.

Local vertical interconnects for monolithic stack transistors

Semiconductor devices and methods of forming the same include forming a bottom source/drain structure around a fin. A multi-layer bottom spacer is formed on the bottom source/drain structure, around the fin. Each layer of the multi-layer bottom spacer has a respective vertical height above the bottom source/drain structure, with a layer of the multi-layer bottom spacer that is farthest from the fin having a greater vertical height than a layer that is closest to the fin, to address parasitic capacitance from the bottom source/drain structure.

Self-aligned uniform bottom spacers for VTFETS

Interconnect structures including super vias are formed during back-end-of-line processing using sacrificial placeholders to protect the bottom portions of the super vias while upper portions of the super vias are formed. The sacrificial placeholders are removed and replaced by metal conductors that fill the bottom and upper portions of the super vias.

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Watervliet, NY, United States of America

Eric Miller