Other

Trimark Corporation

Intest IP Corporation

The Procter Gamble Company

Pfizer Corporation

Intest Corporation

Intest Sunnyvale Corporation

Cadbury Beverages, Inc.

Eger; Douglas R.

Douglas W Smith

Robert E Dawson

Thornton W Sargent, Iv

Donald E Schenk

Kevin P Eschweiler

Barbara J Pickar

Douglas R Eger

Amanda O'Connell

Stephen Jaymes Becker

Philip Doepker

Le Allen Richardson

Virginia Lynn Tremblay

Hannah Jiin Chung

Shannon Driskell

Joshua Robert Craven

Emily Kitchings Kokenge

Geneva Gail Otten

Anita L Reichling

Jayden F Burns

Christopher R Zenner

Stuart F Daniels

Edward S Tieke

John S Gruver

Stanley A Danowski

A polygonal device for teaching students who prefer kinesthetic learning methods is presented in which the polygonal device can represent two-dimensional polygons of varying shapes and sizes. One or more of the sides, or legs, of the polygonal device are extendable, and the angles of the polygonal device may be manipulated to a desired angle. The devices presented include, but are not limited to, triangles, quadrilaterals, parallelograms, rectangles, squares, trapezoids, and kites. In each of these devices, the legs of the device are non-detachable, i.e. the device does not come apart during normal manipulation and operation.

Polygonal device for kinesthetic learners

Motor home entrance door handle

Inside door handle for motor vehicle

Key RF FOB

In an electrically shielded connector, conductive material covers an outer surface of said body and is spaced away from a conductive structure included in the connector to create electrical isolation therebetween. A channel in which the connector is situated is either plugged when conductive material is applied to the connector during manufacturing or is counter bored to create the electrical isolation.

Method of fabricating a connector

An apparatus and method for coupling a test head and probe card in an IC testing system incorporating patterned divider elements () disposed between rows of signal conductors () to provide matching characteristic impedance values along each row of signal conductors. The divider elements have a patterned conductive layer formed thereon that is electrically connected to ground, and a method for determining a useful pattern is provided. Test dividers () fabricated with openings of various size and shape are used to construct transmission lines. The impedance of these lines is measured, and the results are used to interpolate an appropriate opening size and shape to achieve a desired transmission line impedance.

Interface apparatus for integrated circuit testing

Electrically shielded connector

A bi-directional interface for transmitting signals between a circuit tester and a connection point proximate to a circuit to be tested includes a first and a second optical fiber link, a first directional gate for coupling both the input end of the first link and the output end of the second link to one endpoint of the interface and a second directional gate for coupling both the input end of the second link and the output end of the first link to the other endpoint of the interface. An optical fiber link includes an optical fiber, a light source, and a photodetector.

Optical fiber interface for integrated circuit test system

A bi-directional interface for transmitting signals between a circuit tester and a connection point proximate to a circuit to be tested includes a first and a second optical fiber link, a first directional gate for coupling both the input end of the first link and the output end of the second link to one endpoint of the interface and a second directional gate for coupling both the input end of the second link and the output end of the first link to the other endpoint of the interface. An optical fiber link for transmitting a signal between a circuit tester and a connection point proximate to a circuit to be tested includes an optical fiber for transmitting the signal, a light source electrically coupled to the link input and optically coupled to the input of the fiber, and a photodetector optically coupled to the fiber output and electrically coupled to the link output.

An apparatus for coupling a test head and probe card in a wafer testing system incorporates a number of features that contribute to low impedance and reduced cross-talk, making the coupling apparatus particularly advantageous for high-speed test applications. The coupling apparatus may include, for example, an array of discrete conductor conduits that contain individual conducting elements. The conduits can be insulated, if desired, to reduce leakage. Further, the conduits can be made from metal, and terminated in dielectric interface plates for improved impedance matching. Divider elements can be provided to physically and electrically isolate adjacent rows of conductor conduits. Also, adjacent conducting elements can be connected to carry ground and signal potentials in an alternating manner such that signal carrying elements in a common row are separated from one another by ground carrying elements.

Apparatus for coupling a test head and probe card in a wafer testing system

A bi-directional interface for transmitting signals between a circuit tester and a connection point proximate to a circuit to be tested includes a first and a second optical fiber link, a first directional gate for coupling both the input end of the first link and the output end of the second link to one endpoint of the interface and a second directional gate for coupling both the input end of the second link and the output end of the first link to the other endpoint of the interface. An optical fiber link for transmitting a signal between a circuit tester and a connection point proximate to a circuit to be tested includes an optical fiber for transmitting the signal, a light source electrically coupled to the link input and optically coupled to the input of the fiber, and a photodetector optically coupled to the fiber output and electrically coupled to the link output. The light source may include a light emitter and a driver stage electrically coupled to the light emitter. The link input may include a load adapter or a programmable load to receive the signal for the driver stage. For processing the output of the photodetector the link may have a receiver stage, followed by an equalizer stage, followed by a high-pass filter stage, followed by a power output stage.

Spout

Container having a curved back panel

Growing community of inventors

Los Altos, CA, United States of America

Douglas W Smith