Growing community of inventors

Englewood, OH, United States of America

David L Flannery

Average Co-Inventor Count = 4.22

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 49

David L FlanneryDavid R Seitz (3 patents)David L FlanneryEric J Serenius (2 patents)David L FlanneryWei Zhao (2 patents)David L FlanneryMichael Duane Christopher (2 patents)David L FlanneryDavid R Setiz (2 patents)David L FlanneryThomas P Staub (2 patents)David L FlanneryKenneth William Jackson (1 patent)David L FlanneryEric Serenius (1 patent)David L FlanneryMatthew A Thomas (1 patent)David L FlanneryEric R Auberry (1 patent)David L FlanneryDavid L Flannery (5 patents)David R SeitzDavid R Seitz (33 patents)Eric J SereniusEric J Serenius (9 patents)Wei ZhaoWei Zhao (2 patents)Michael Duane ChristopherMichael Duane Christopher (2 patents)David R SetizDavid R Setiz (2 patents)Thomas P StaubThomas P Staub (2 patents)Kenneth William JacksonKenneth William Jackson (7 patents)Eric SereniusEric Serenius (4 patents)Matthew A ThomasMatthew A Thomas (3 patents)Eric R AuberryEric R Auberry (2 patents)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Mdc Max Daetwyler Ag (3 from 8 patents)

2. Ohio Electronic Engravers, Inc. (2 from 51 patents)


5 patents:

1. 6614558 - Engraver and method for focusing and measuring areas on a workpiece engraved by the engraver

2. 6362899 - Error detection apparatus and method for use with engravers

3. 6348979 - Engraving system and method comprising improved imaging

4. 5737090 - System and method for focusing, imaging and measuring areas on a

5. 5671063 - Error tolerant method and system for measuring features of engraved areas

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